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All Technical Committee Conferences (Searched in: All Years)
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Search Results: Conference Papers |
Conference Papers (Available on Advance Programs) (Sort by: Date Descending) |
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Committee |
Date Time |
Place |
Paper Title / Authors |
Abstract |
Paper # |
ICD, SDM |
2014-08-04 10:50 |
Hokkaido |
Hokkaido Univ., Multimedia Education Bldg. |
A 28nm High-k/MG Heterogeneous Multi-Core Mobile Application Processor with 2GHz Cores and Low-Power 1GHz Cores Mitsuhiko Igarashi, Toshifumi Uemura, Ryo Mori, Hiroshi Kishibe, Masaaki Taniguchi, Kohei Wakahara, Toshiharu Saito, Masaki Fujigaya, Kazuki Fukuoka, Koji Nii, Takeshi Kataoka, Toshihiro Hattori (Renesas Electronics) SDM2014-64 ICD2014-33 |
This paper presents power management and low power techniques of our heterogeneous quad/octa-core mobile application pro... [more] |
SDM2014-64 ICD2014-33 pp.11-16 |
SDM, ICD |
2013-08-02 15:10 |
Ishikawa |
Kanazawa University |
[Invited Talk]
A single chip LTE capable communication processor R-Mobile U2 and its technologies in power management
-- Clock control method by the power saver -- Masaki Fujigaya, Noriaki Sakamoto, Takao Koike, Takahiro Irita, Kohei Wakahara, Tsugio Matsuyama, Keiji Hasegawa, Toshiharu Saito, Akira Fukuda, Kaname Teranishi (Renesas Mobile Corp.), Kazuki Fukuoka, Noriaki Maeda, Koji Nii (Renesas Electronics Corp.), Takeshi Kataoka, Toshihiro Hattori (Renesas Mobile Corp.) SDM2013-84 ICD2013-66 |
The “R-Mobile U2” is a single chip integration of LTE capable base band and 1.5 GHz dual-core application processor. In ... [more] |
SDM2013-84 ICD2013-66 pp.99-103 |
R |
2007-10-19 16:40 |
Fukuoka |
Kyushu University |
A Low Overhead Dependable Microcontroller Architecture with Instruction-level Rollback for Soft Error Recovery Teruaki Sakata, Teppei Hirotsu, Hiromichi Yamada (Hitachi), Takeshi Kataoka (Renesas) R2007-45 |
A low overhead, dependable microcontroller architecture has been developed. Soft errors occur in flip-flops are detected... [more] |
R2007-45 pp.47-52 |
R, ED, SDM |
2005-11-25 14:00 |
Osaka |
Central Electric Club |
Localization Method of Failure Point with Scan Chain Takeshi Kataoka, Hisakazu Watanabe, Yasushi Kannan, Masaji Tanaka (Matsushita Electric Industrial) |
Fault diagnosis system which extracts a suspicion failure node of the logic circuit by using LSI tester and analytical ... [more] |
R2005-42 ED2005-177 SDM2005-196 pp.25-30 |
IE, SIP, ICD, IPSJ-SLDM |
2004-10-22 11:15 |
Yamagata |
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Low-Latency and Small-Code-Size Microcontroller Core for Automotive, Industrial, and PC-Peripheral Applications Yasuo Sugure (Hitachi), Seiji Takeuchi (Renesas), Yuichi Abe, Hiromichi Yamada (Hitachi), Kazuya Hirayanagi, Akihiko Tomita, Kesami Hagiwara, Takeshi Kataoka (Renesas), Takanori Shimura (Hitachi) |
A 32-bit embedded RISC microcontroller core targeted for automotive, industrial, and PC-peripheral applications has been... [more] |
SIP2004-93 ICD2004-125 IE2004-69 pp.25-30 |
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