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Search Results: Conference Papers
 Conference Papers (Available on Advance Programs)  (Sort by: Date Descending)
 11件中 1~11件目  /   
Committee Date Time Place Paper Title / Authors Abstract Paper #
EMCJ, MW, EST, IEE-EMC [detail] 2019-10-25
11:15
Miyagi Tohoku Gakuin University(Conf. Room 2, Eng. Bldg. 1) Experimental Evaluation of a Prototype TEM Horn for Radiated Immunity Test in Close Proximity
Katsushige Harima (NICT), Takayuki Kubo, Takeshi Ishida (Noise Laboratory) EMCJ2019-58 MW2019-87 EST2019-66
We have fabricated a prototype TEM horn antenna for radiated immunity tests in close proximity as specified in IEC 61000... [more] EMCJ2019-58 MW2019-87 EST2019-66
pp.125-129
EST, MW, EMCJ, IEE-EMC [detail] 2018-10-18
13:05
Aomori Hachinohe Chamber of Commerce and Industry(Hachinohe city, Aomori) Evaluation of a TEM Horn Antenna for Radiated Immunity Testing in Close Proximity
Katsushige Harima (NICT), Takayuki Kubo, Takeshi Ishida (Noise Laboratory) EMCJ2018-38 MW2018-74 EST2018-60
We designed a shortened exponentially tapered TEM horn for use in close proximity radiated immunity testing and optimize... [more] EMCJ2018-38 MW2018-74 EST2018-60
pp.23-27
EMCJ, WPT, PEM
(Joint)
2016-11-24
11:30
Tokyo Kikai-Shinko-Kaikan Bldg. electrode structure of the log-periodic dipole antenna arrays for sensitive optical electric field sensors
Akihisa Tsuchiya, Naomi Hidaka, Hideaki Sugama (KITC), Takeshi Ishida (Noise Lab.), Osamu Hashimoto (Aoyama Gakuin Univ.)
An evaluation of the sensitivity characteristics of our improved optical electric field sensor that incorporates our log... [more]
EMCJ, PEM
(Joint)
2014-11-14
15:15
Tokyo AIST Tokyo Waterfront A Study of Electrostatic Discharge Immunity Testing for Wearable Equipment
Takeshi Ishida (Noiseken/UEC), Fengchao Xiao, Yoshio Kami, Osamu Fujiwara, Shuichi Nitta (UEC) EMCJ2014-72
The electrostatic discharge (ESD) immunity test for electronic equipment is specified in the international standard IEC ... [more] EMCJ2014-72
pp.31-35
PEM
(2nd)
2014-07-04
14:00
Kanagawa   [Invited Lecture] The Optical Electric Field Sensor Works in High Sensitivity in Microwave Band
Naomi Hidaka, Hideaki Sugama, Akihisa Tsuchiya (KITC), Shingo Tsujino (AGU), Takeshi Ishida (NoiseKen), Osamu Hashimoto (AGU)
By using our improved Optical Electric Field Sensor (OEFS) that incorporates our Log-Periodic Diopole Antenna Array (LPD... [more]
SDM 2008-06-10
13:45
Tokyo An401・402, Inst. Indus. Sci., The Univ. of Tokyo Theoretical Studies on the Charge Trap Mechanisms of MONOS Memories
Kenji Shiraishi, Kenji Kobayashi (Univ of Tsukuba), Takeshi Ishida, Yutaka Okuyama, Renichi Yamada (Central Research Labs., Hitachi) SDM2008-55
 [more] SDM2008-55
pp.77-82
EMCJ 2008-03-07
11:50
Tokyo Kikai-Shinko-Kaikan Bldg Development of Optical Electric Field Sensor for Electromagnetic Environmental Measurement of Microwave Band
Hideaki Sugama, Akihisa Tsuchiya, Naomi Hidaka (KITC), Takeshi Ishida (Noiseken), Ryousuke Obayashi, Osamu Hashimoto (Aoyama Gakuin Univ) EMCJ2007-122
We improved the reception sensitivity of Log-Periodic Dipole Antenna Array (LPDA) -type optical electric field sensor wi... [more] EMCJ2007-122
pp.31-36
AP 2008-02-07
10:30
Tokyo NHK Characteristics of reflective LPDA (Log-Periodic Dipole Antenna Array)-type optical electric field sensor
Naomi Hidaka, Hideaki Sugama, Akihisa Tsuchiya (KITC), Takeshi Ishida (Noiseken), Ryousuke Obayashi, Osamu Hashimoto (AGU) AP2007-163
Single optical waveguide was first used to fabricate Log-Periodic Dipole Antenna Array (LPDA) -type Optical Electric Fie... [more] AP2007-163
pp.1-5
SDM 2007-06-07
13:30
Hiroshima Hiroshima Univ. ( Faculty Club) Analysis of Electron and Hole Trap in MONOS-type Nonvolatile Memory
Takeshi Ishida, Renichi Yamada, Kazuyoshi Torii (Hitachi), Kenji Shiraishi (Univ. of Tsukuba) SDM2007-31
For the purpose of providing higher reliability to MONOS (Metal-Oxide-Nitride-Oxide-Silicon) type nonvolatile memory, we... [more] SDM2007-31
pp.1-6
SDM 2007-06-07
13:55
Hiroshima Hiroshima Univ. ( Faculty Club) Electron Trap Characteristics of Si3N4/SRN/Si3N4 stacked films
Toshiyuki Mine, Takeshi Ishida, Hirotaka Hamamura, Kazuyoshi Torii (Hitachi) SDM2007-32
For the purpose of providing higher reliability to MONOS (Metal-Oxide-Nitride-Oxide-Silicon) type nonvolatile memory, we... [more] SDM2007-32
pp.7-11
MW 2006-06-27
15:20
Aichi   A Study on Phase Relation of Resonant Antenna Elements and sensitivity behavior in LPDA-Type Optical Electric Field Sensor
Ryousuke Obayashi (Aoyamagakuin Univ.), Hideaki Sugama, Naomi Hidaka, Ryou Usui, Akihisa Tsuchiya, Ken Kobayashi (Kanagawa Industrial Technology center), Takeshi Ishida, Takashi Nakamura (NOISE Lab.), Osamu Hashimoto (Aoyamagakuin Univ.)
This study was implemented to improve the characteristic of
LPDA(Log-Periodic Dipole Antenna Array)-Type Optical Elect... [more]
MW2006-33
pp.47-52
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