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Committee Date Time Place Paper Title / Authors Abstract Paper #
DC 2011-02-14
10:00		 Tokyo Kikai-Shinko-Kaikan Bldg. The development of the DDR3 memory module tester used on memory test processor
Takeshi Asakawa, Satoshi Matsuno (Tokai Univ.), Hidekazu Tsuchiya (Hitachi), Tatsuya Seki, Shinichi Kmazawa (Techinica) DC2010-59		 The testing for the memory module is necessary to warrant the quality in the memory module manufacturer. However, there ... [more] DC2010-59
pp.1-6
DC 2008-02-08
16:05		 Tokyo Kikai-Shinko-Kaikan Bldg. Current dissipation of Test pattern generators using ATPG vectors
Hidekazu Tsuchiya, Takaya Abe, Takeshi Asakawa (Tokai univ.) DC2007-80		 Recently, the operating speed of LSI is more fast and the scale of LSI is more larger. These induce increasing the dissi... [more] DC2007-80
pp.83-88
R 2007-09-14
14:05		 Kochi Kochi Univ. of Technology Evaluation of transmission line for LSI tester and simulation modeling
Hidekazu Tsuchiya, Takeshi Asakawa (Tokai univ.), Masayuki Sato (Genesis technology) R2007-34		 Recently, the operating speed of LSI is more fast. Therefore, it is more important to evaluate the transmission line of ... [more] R2007-34
pp.29-34
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