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All Technical Committee Conferences (Searched in: All Years)
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Search Results: Conference Papers |
Conference Papers (Available on Advance Programs) (Sort by: Date Descending) |
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Committee |
Date Time |
Place |
Paper Title / Authors |
Abstract |
Paper # |
PRMU, HIP |
2012-03-30 09:00 |
Hyogo |
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Dome Type Audio Visual MR Environment and Its Core Software Library Shogo Suzuki, Takayuki Sugiyama, Takafumi Miyai, Asako Kimura, Fumihisa Shibata, Hideyuki Tamura (Ritsumeikan Univ.) PRMU2011-261 HIP2011-89 |
In the field of Mixed Reality (MR), MR of visual sense is typical. We develop an MR system that merged the real and virt... [more] |
PRMU2011-261 HIP2011-89 pp.135-140 |
CPM, SDM, ED |
2011-05-20 11:15 |
Aichi |
Nagoya Univ. (VBL) |
Aging test of AlGaN-based ultraviolet light emitting diodes
-- The Degradation Mechanism of UV-LED -- Park Gwi Jin, Takayuki Sugiyama, Tomoyuki Tanikawa, Yoshio Honda, Masahito Yamaguchi, Hiroshi Amano (Nagoya Univ.), Tetsuhiko Inazu, Takehiko Fujita, Cyril Pernot, Akira Hirano (UV Craftory) ED2011-24 CPM2011-31 SDM2011-37 |
[more] |
ED2011-24 CPM2011-31 SDM2011-37 pp.123-126 |
CPM, SDM, ED |
2011-05-20 16:40 |
Aichi |
Nagoya Univ. (VBL) |
Current collapse in GaN-based HFETs
-- HFETs on c- and a-GaN substrate/normally-off JHFET with p-GaN gate -- Takayuki Sugiyama, Yoshio Honda, Masahito Yamaguchi, Hiroshi Amano (Nagoya Univ.), Yasuhiro Isobe, Yoshinori Oshimura, Motoaki Iwaya, Tetsuya Takeuchi, Satoshi Kamiyama, Isamu Akasaki (Meijo Univ.), Mamoru Imade, Yasuo Kitaoka, Yusuke Mori (Osaka Univ.) ED2011-34 CPM2011-41 SDM2011-47 |
We measured current collapse in AlGaN/GaN HFETs on an a-plane GaN substrate. Non polar HFETs are promising for realizing... [more] |
ED2011-34 CPM2011-41 SDM2011-47 pp.175-178 |
ED |
2009-07-30 16:15 |
Osaka |
Osaka Univ. Icho-Kaikan |
Threshold voltage control and temperature dependence of normally off mode AlGaN/GaN HFET with p-type GaN gate Takayuki Sugiyama, Daisuke Iida, Motoaki Iwaya, Satoshi Kamiyama, Hiroshi Amano, Isamu Akasaki (Meijo Univ.) ED2009-108 |
[more] |
ED2009-108 pp.33-37 |
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