IEICE Technical Committee Submission System
Conference Schedule
Online Proceedings
[Sign in]
Tech. Rep. Archives
    [Japanese] / [English] 
( Committee/Place/Topics  ) --Press->
( Paper Keywords:  /  Column:Title Auth. Affi. Abst. Keyword ) --Press->

All Technical Committee Conferences  (All Years)

Search Results: Conference Papers
 Conference Papers (Available on Advance Programs)  (Sort by: Date Descending)
 Results 1 - 3 of 3  /   
Committee Date Time Place Paper Title / Authors Abstract Paper #
ICD, SDM 2007-08-24
Hokkaido Kitami Institute of Technology An analysis of asymmetry and orientation dependence of n-MOSFETs
Toshihiro Matsuda, Yuya Sugiyama, Hideyuki Iwata (Toyama Pref. Univ.), Takashi Ohzone (Okayama Pref. Univ.) SDM2007-161 ICD2007-89
n-MOSFETs with 8 different channel orientation and three kinds of process conditions were measured and symmetry of IDsat... [more] SDM2007-161 ICD2007-89
ICD, SDM 2006-08-18
Hokkaido Hokkaido University A Test Structure to Separately Analyze CMOSFET Reliabilities along The Channel Width
Takashi Ohzone, Eiji Ishii, Takayuki Morishita, Kiyotaka Komoku (Okayama Pref. Univ.), Toshihiro Matsuda, Hideyuki Iwata (Toyama Pref. Univ.)
A test structure with four kinds of MOSFETs(i.e., [A]([D]) with a short(long) channel-length all over the channel width,... [more] SDM2006-142 ICD2006-96
ICD, SDM 2005-08-18
Hokkaido HAKODATE KOKUSAI HOTEL A Test Structure to Analyze (Highly-Doped)/(Lightly-Doped)-Drain in LDD-type CMOSFET
Takashi Ohzone (Okayama Pref. Univ.), Toshihiro Matsuda (Toyama Pref. Univ.), Kazuhiko Okada, Takayuki Morishita, Kiyotaka Komoku (Okayama Pref. Univ.), Hideyuki Iwata (Toyama Pref. Univ.)
A test structure to separately measure sheet resistances of highly-doped-drain (HDD) and lightly- doped-drain (LDD) in L... [more] SDM2005-137 ICD2005-76
 Results 1 - 3 of 3  /   
Choose a download format for default settings. [NEW !!]
Text format pLaTeX format CSV format BibTeX format
Copyright and reproduction : All rights are reserved and no part of this publication may be reproduced or transmitted in any form or by any means, electronic or mechanical, including photocopy, recording, or any information storage and retrieval system, without permission in writing from the publisher. Notwithstanding, instructors are permitted to photocopy isolated articles for noncommercial classroom use without fee. (License No.: 10GA0019/12GB0052/13GB0056/17GB0034/18GB0034)

[Return to Top Page]

[Return to IEICE Web Page]

The Institute of Electronics, Information and Communication Engineers (IEICE), Japan