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Committee Date Time Place Paper Title / Authors Abstract Paper #
LQE, CPM, ED 2017-11-30
16:15		 Aichi Nagoya Inst. tech. Mapping of wavy surface morphology of n-GaN using scanning internal photoemission microscopy
Kenji Shiojima, Takanori Hashizume (Univ. of Fukui), Masafumi Horikiri, Takeshi Tanaka (SCIOCS), Tomoyoshi Mishima (Hosei Univ.) ED2017-55 CPM2017-98 LQE2017-68		 We characterized the effect of the surface morphology on electrical properties of the n-GaN drift-layers by using scanni... [more] ED2017-55 CPM2017-98 LQE2017-68
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