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Committee Date Time Place Paper Title / Authors Abstract Paper #
VLD 2010-03-10
16:15		 Okinawa   An efficient technique to search failure-areas for yield estimation via partial hyperspherephere
Takanori Date, Shiho Hagiwara, Kazuya Masu (Tokyo Inst. of Tech.), Takashi Sato (Kyoto Univ.) VLD2009-105		 Monte Carlo simulations have been widely adopted for analyzing circuit properties, such as SRAM yield,
under strong inf... [more]		 VLD2009-105
pp.37-42
VLD, IPSJ-SLDM 2009-05-21
10:25		 Fukuoka Kitakyushu International Conference Center Importance sampling with two-phase preprocess considering structural symmetry of SRAM circuits
Takanori Date, Shiho Hagiwara, Takumi Uezono (Tokyo Inst. of Tech.), Takashi Sato (Kyoto Univ.), Kazuya Masu (Tokyo Inst. of Tech.) VLD2009-5		 The influence of process variation on SRAM yield has become a serious consern in scaled technologies.
Monte Carlo-based... [more]		 VLD2009-5
pp.37-42
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