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Committee Date Time Place Paper Title / Authors Abstract Paper #
PRMU, IBISML, IPSJ-CVIM [detail] 2011-09-06
Hokkaido   Efficient Learning for Successive TFC by Selective Assessment for defect Classification
Yoshikazu Matsuo (Hokkaido Univ.), Takamichi Kobayashi (NSC), Hidenori Takauji (MIT), Shun'ichi Kaneko (Hokkaido Univ.) PRMU2011-75 IBISML2011-34
We had proposed the method Test Feature Classifier(TFC) as a Nonparametoric Classifier and Successive TFC(sTFC). We prop... [more] PRMU2011-75 IBISML2011-34
PRMU 2009-03-14
Miyagi Tohoku Institute of Technology Analysis of maturing for Successive Test Feature Classifier
Yoshikazu Matsuo (Hokkaido Univ.), Takamichi Kobayashi (Nippon Steel.), Hidenori Takauji, Shun'ichi Kaneko (Hokkaido Univ.) PRMU2008-274
In the Test Feature Classifier(TFC), Successive Test Feature
Classifier(sTFC) which method enable to create higher
q... [more]
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