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Committee Date Time Place Paper Title / Authors Abstract Paper #
DC 2023-02-28
16:40		 Tokyo Kikai-Shinko-Kaikan Bldg
(Primary: On-site, Secondary: Online)		 Effective Switching Probability Calculation to Locate Hotspots in Logic Circuit
Taiki Utsunomiya, Kohei Miyase, Ryu Hoshino (Kyutech), Shyue-Kung Lu (NTUST), Xiaoqing Wen, Seiji Kajihara (Kyutech) DC2022-92		 High power consumption in LSI testing may cause excessive IR-drop. When IR-drop becomes excessive, it causes excessive d... [more] DC2022-92
pp.56-61
DC 2022-03-01
14:20		 Tokyo Kikai-Shinko-Kaikan Bldg.
(Primary: On-site, Secondary: Online)		 Evaluation of Efficiency for a Method to Locate High Power Consumption with Switching Provability
Ryu Hoshino, Taiki Utsunomiya, Kohei Miyase, Xiaoqing Wen, Seiji Kajihara (Kyutech) DC2021-73		 In recent years, as the high speed and miniaturization of LSIs have improved, it has become more difficult to test LSIs．... [more] DC2021-73
pp.51-56
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