IEICE Technical Committee Submission System
Conference Schedule
Online Proceedings
[Sign in]
Tech. Rep. Archives
    [Japanese] / [English] 
( Committee/Place/Topics  ) --Press->
 
( Paper Keywords:  /  Column:Title Auth. Affi. Abst. Keyword ) --Press->

All Technical Committee Conferences  (All Years)

Search Results: Conference Papers
 Conference Papers (Available on Advance Programs)  (Sort by: Date Descending)
 Results 1 - 4 of 4  /   
Committee Date Time Place Paper Title / Authors Abstract Paper #
SDM, ICD 2013-08-02
14:25
Ishikawa Kanazawa University [Invited Talk] A 10th Generation 16-Core SPARC64 Processor for Mission-Critical UNIX Server
Ryuji Kan, Tomohiro Tanaka, Go Sugizaki, Ryuichi Nishiyama, Sota Sakabayashi (Fujitsu), Yoichi Koyanagi (Fujitsu Laboratories), Ryuji Iwatsuki, Kazumi Hayasaka (Fujitsu), Taiki Uemura (Fujitsu Semiconductor), Gaku Itou, Yoshitomo Ozeki, Hiroyuki Adachi, Kazuhiro Furuya, Tsuyoshi Motokurumada (Fujitsu) SDM2013-83 ICD2013-65
A 10th generation SPARC64 processor is fabricated in enhanced 28nm CMOS process. It runs at 3.0GHz and contains 16 cores... [more] SDM2013-83 ICD2013-65
pp.95-98
ICD 2012-12-18
10:55
Tokyo Tokyo Tech Front [Invited Talk] Soft-error evaluation and mitigation technologies
Taiki Uemura (Fujitsu Semiconductor Ltd.) ICD2012-116
Soft-Error is transient error in electron devices. Soft-error is triggered by cosmic-ray induced neutrons and alpha rays... [more] ICD2012-116
pp.103-108
SDM 2010-11-12
13:50
Tokyo Kikai-Shinko-Kaikan Bldg. Modeling of Single-Event-Transient Pulse Generation in Inverter Cells
Katsuhiko Tanaka, Hideyuki Nakamura, Taiki Uemura, Kan Takeuchi, Toshikazu Fukuda, Shigetaka Kumashiro, Tohru Mogami (MIRAI-Selete) SDM2010-180
Soft errors in logic circuits due to the propagation of erroneous signal caused by ionized particle generated by cosmic ... [more] SDM2010-180
pp.47-52
ICD 2005-04-15
14:30
Fukuoka   New Development of Neutron-induced Soft-Error Simulation Technology
Taiki Uemura, Yoshiharu Tosaka, Yoshio Ashizawa, Hideki Oka, Shigeo Satoh (Fujitsu lab.)
In these years, the interest in soft error becomes increasing. This comes from the problem that the soft error occurs no... [more] ICD2005-19
pp.37-42
 Results 1 - 4 of 4  /   
Choose a download format for default settings. [NEW !!]
Text format pLaTeX format CSV format BibTeX format
Copyright and reproduction : All rights are reserved and no part of this publication may be reproduced or transmitted in any form or by any means, electronic or mechanical, including photocopy, recording, or any information storage and retrieval system, without permission in writing from the publisher. Notwithstanding, instructors are permitted to photocopy isolated articles for noncommercial classroom use without fee. (License No.: 10GA0019/12GB0052/13GB0056/17GB0034/18GB0034)


[Return to Top Page]

[Return to IEICE Web Page]


The Institute of Electronics, Information and Communication Engineers (IEICE), Japan