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 Conference Papers (Available on Advance Programs)  (Sort by: Date Descending)
 Results 1 - 7 of 7  /   
Committee Date Time Place Paper Title / Authors Abstract Paper #
SDM 2009-10-29
17:15		 Miyagi Tohoku University Statistical Analysis of Random Telegraph Signal Using a Large-Scale Array TEG with a Long Time Measurement
Takafumi Fujisawa, Kenichi Abe, Syunichi Watabe, Naoto Miyamoto, Akinobu Teramoto, Shigetoshi Sugawa, Tadahiro Ohmi (Tohoku Univ.) SDM2009-123		 For the development of miniaturizing MOSFET and manufacturing low noise devices, it is important to suppress RTS noise. ... [more] SDM2009-123
pp.31-36
SDM, ED 2009-06-24
16:45		 Overseas Haeundae Grand Hotel, Busan, Korea A Statistical Analysis of Distributions of RTS Characteristics by Wide-Range Sampling Frequencies
Kenichi Abe, Takafumi Fujisawa, Akinobu Teramoto, Syunichi Watabe, Shigetoshi Sugawa, Tadahiro Ohmi (Tohoku Univ.) ED2009-57 SDM2009-52		  [more] ED2009-57 SDM2009-52
pp.29-32
SDM 2008-10-10
14:00		 Miyagi Tohoku Univ. Statistical evaluation of characteristics variation and RTS noise of MOSFETs
Takafumi Fujisawa, Shigetoshi Sugawa, Syunichi Watabe, Kenichi Abe, Akinobu Teramoto, Tadahiro Ohmi (Tohoku Univ.) SDM2008-163		  [more] SDM2008-163
pp.45-50
SDM 2008-10-10
15:15		 Miyagi Tohoku Univ. Correlation between Stress Induced Leakage Current and Random Telegraph Signal noise
Yuki Kumagai, Akinobu Teramoto, Kenichi Abe, Takafumi Fujisawa, Syunichi Watabe, Tomoyuki Suwa, Naoto Miyamoto, Shigetoshi Sugawa, Tadahiro Ohmi (Tohoku Univ.) SDM2008-165		 In this paper, we report the correlation between anomalous stress-induced leakage current (SILC) and random telegraph si... [more] SDM2008-165
pp.57-62
SDM 2007-10-05
13:35		 Miyagi Tohoku Univ. High Performance Accumulation Mode FD-SOI MOSFETs on Si(100) and (110) Surfaces
Weitao Cheng, Akinobu Teramoto, Rihito Kuroda, Chingfoa Tye, Syunichi Watabe, Tomoyuki Suwa, Tetsuya Goto, Fuminobu Imaizumi, Shigetoshi Sugawa, Tadahiro Ohmi (Tohoku Univ.) SDM2007-187		  [more] SDM2007-187
pp.45-48
SDM 2007-10-05
15:50		 Miyagi Tohoku Univ. Statistical Evaluation of Random Telegraph Signal Using a Very Large-scale Array TEG
Kenichi Abe, Shigetoshi Sugawa, Rihito Kuroda, Syunichi Watabe, Akinobu Teramoto, Tadahiro Ohmi (Tohoku Univ.) SDM2007-192		 In this work, we propose a statistical evaluation technique of Random Telegraph Signal using a novel Test Element Group ... [more] SDM2007-192
pp.65-68
SDM 2007-10-05
16:15		 Miyagi Tohoku Univ. Statistical Evaluation of Characteristics Variability caused by Plasma Processes
Syunichi Watabe, Shigetoshi Sugawa, Kenichi Abe, Takafumi Fujisawa, Naoto Miyamoto, Akinobu Teramoto, Tadahiro Ohmi (Tohoku Univ.) SDM2007-193		 In this paper, we report the statistical evaluation of characteristics degradation in MOSFETs caused by plasma damages w... [more] SDM2007-193
pp.69-72
 Results 1 - 7 of 7  /   
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