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All Technical Committee Conferences (Searched in: All Years)
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Search Results: Conference Papers |
Conference Papers (Available on Advance Programs) (Sort by: Date Descending) |
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Committee |
Date Time |
Place |
Paper Title / Authors |
Abstract |
Paper # |
ICD |
2016-04-14 15:15 |
Tokyo |
Kikai-Shinko-Kaikan Bldg. |
[Invited Lecture]
1T1MTJ STT-MRAM Cell Array Design with an Adaptive Reference Voltage Generator Hiroki Koike, Sadahiko Miura, Hiroaki Honjo, Tosinari Watanabe, Hideo Sato, Soshi Sato, Takashi Nasuno, Yasuo Noguchi, Mitsuo Yasuhira, Takaho Tanigawa, Masaaki Niwa, Kenchi Ito, Shoji Ikeda, Hideo Ohno, Tetsuo Endoh (Tohoku Univ.) ICD2016-10 |
A device-variation-tolerant spin-transfer-torque magnetic random access memory (STT-MRAM) cell array with a high-signal-... [more] |
ICD2016-10 pp.51-56 |
SDM |
2010-06-22 10:20 |
Tokyo |
An401・402 Inst. Indus. Sci., The Univ. of Tokyo |
An Analysis of Electrical Carrier Mobility of Silicon Nanowire FET Soshi Sato, Kuniyuki Kakushima, Parhat Ahmet (Tokyo Inst. of Tech.), Kenji Ohmori (Waseda Univ.), Kenji Natori, Hiroshi Iwai (Tokyo Inst. of Tech.), Keisaku Yamada (Waseda Univ.) SDM2010-35 |
Silicon nanowire FET is expected to have high ION and low IOFF compared with planar FET, which results in low-power cons... [more] |
SDM2010-35 pp.11-16 |
SDM |
2010-06-22 10:45 |
Tokyo |
An401・402 Inst. Indus. Sci., The Univ. of Tokyo |
Nickel silicide Encroachment in Silicon Nanowire and its Suppression Naoto Shigemori, Soshi Sato, Kuniyuki Kakushima, Parhat Ahmet, Kazuo Tsutsui, Akira Nishiyama, Nobuyuki Sugii, Kenji Natori, Takeo Hattori, Hiroshi Iwai (Tokyo Inst. of Tech.) SDM2010-36 |
Ni silicide in the Si Nanowire shows a reaction different from the reaction with the bulk substrate from the influence o... [more] |
SDM2010-36 pp.17-22 |
SDM |
2007-06-08 11:20 |
Hiroshima |
Hiroshima Univ. ( Faculty Club) |
Effects of Nitrogen Incorporaton into La2O3 using Nitrogen Radicals Soshi Sato, Kiichi Tachi, Jaeyeol Song, Kuniyuki Kakushima, Parhat Ahmet, Kazuo Tsutsui, Nobuyuki Sugii, Takeo Hattori, Hiroshi Iwai (Tokyo Tech.) SDM2007-44 |
This work reports the influence of nitridation on structural and electrical properties of La2O3 gate dielectric films. T... [more] |
SDM2007-44 pp.71-74 |
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