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Committee Date Time Place Paper Title / Authors Abstract Paper #
EMCJ 2014-04-18
13:55
Toyama Univ. Toyama Development of High Sensitivity On-chip Active Magnetic Field Probe for IC-chip level RF EM Noise Measurement
Yojiro Shigeta, Noriyuki Sato, Kaoru Arai, Masahiro Yamaguchi (Tohoku Univ.), Singo Kageyama (TDC) EMCJ2014-3
An on-chip active magnetic field probe having high sensitivity and high spatial resolution simultaneously has been desig... [more] EMCJ2014-3
pp.13-18
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