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Committee Date Time Place Paper Title / Authors Abstract Paper #
HWS 2018-04-13
11:35
Fukuoka   Optical 3D Nano Artifact-metrics using White Light Interferometry
Naoki Yoshida (YNU), Yosuke Ueba, Shumpei Nishio, Yasuyuki Ohyagi (DNP), Morihisa Hoga (Compass21), Naoya Tate (KU), Makoto Naruse (NICT), Tsutomu Matsumoto (YNU) HWS2018-3
We propose an artificial-metric system which authenticates nanostructures with random irregularities by means of an inte... [more] HWS2018-3
pp.11-16
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