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Committee Date Time Place Paper Title / Authors Abstract Paper #
EMD 2021-03-08
Online Online Fundamental Study on Effect of Surface Roughness of Contact Boundary and Torque Value on High-Frequency Characteristics of Connectors
Hiroyuki Ueda, Shugo Kaji, Daisuke Fujimoto, Youngwoo Kim, Yuichi Hayashi (NAIST) EMD2020-37
Wear occurs on the contact surface due to sliding and vibration of the connector. This increases the contact resistance,... [more] EMD2020-37
EMD 2020-12-04
Online Online Fundamental Evaluation of Impedance Variations in the Connector Caused by High-Frequency Noise Propagation
Hiroyuki Ueda, Shugo Kaji, Youngwoo Kim, Daisuke Fujimoto (NAIST), Taiki Kitazawa, Takashi Kasuga (NIT,Nagano College)), Yuichi Hayashi (NAIST) EMD2020-24
As the operating frequency of information devices increases, the noise generated by the device is also becoming broadban... [more] EMD2020-24
ICD, HWS [detail] 2020-10-26
Online Online Fundamental Evaluation Method of EM Information Leakage Caused by Intentional Electromagnetic Interference -- Impact of Impedance Change in Digital Output Circuits --
Shugo Kaji, Daisuke Fujimoto (NAIST), Masahiro Kinugawa (Univ. of Fukuchiyama), Yuichi Hayashi (NAIST) HWS2020-27 ICD2020-16
New threats have been shown to cause information leakage by irradiating electromagnetic (EM) waves of specific intensity... [more] HWS2020-27 ICD2020-16
EMCJ 2020-07-02
Online Online Fundamental Evaluation of EM Information Leakage Caused by Intentional Electromagnetic Interference
Shugo Kaji, Daisuke Fujimoto, Yuichi Hayashi (NAIST) EMCJ2020-15
The threat of electromagnetic (EM) information leakage has been focused on the acquisition of information inside the dev... [more] EMCJ2020-15
SeMI 2020-01-31
Kagawa   [Poster Presentation] Disaster Aid Station Management System with Data Exchange Support for Collaborative Activities
Shugo Kajita, Edgar Marko Trono, Gemalyn Abrajano, Jovilyn Fajardo, Taka Maeno (Space-Time Engineering Japan, Inc.) SeMI2019-108
In the event of a large scale disaster such as the Nankai Trough Earthquake, wide-area medical rescue activities will be... [more] SeMI2019-108
Tokyo Asakusabashi Hulic Conference [Poster Presentation] Evaluation of Information Leakage Induced by IEMI from ICs with Multiple Data Communication Lines
Riho Kawakami, Shugo Kaji (NAIST), Masahiro Kinugawa (NIT, Sendai College), Daisuke Fujimoto, Yu-ichi Hayashi (NAIST)
ISEC, SITE, ICSS, EMM, HWS, BioX, IPSJ-CSEC, IPSJ-SPT [detail] 2019-07-24
Kochi Kochi University of Technology Fundamental Study on an Estimation Method of Irradiate Frequencies to Forcibly Cause Electromagnetic Information Leakage
Shugo Kaji (NAIST), Masahiro Kinugawa (NIT), Daisuke Fujimoto, Yu-ichi Hayashi (NAIST) ISEC2019-40 SITE2019-34 BioX2019-32 HWS2019-35 ICSS2019-38 EMM2019-43
The threats of electromagnetic (EM) information leakage from the input/output (I/O) signal of an IC mounted on a de-vice... [more] ISEC2019-40 SITE2019-34 BioX2019-32 HWS2019-35 ICSS2019-38 EMM2019-43
HWS 2019-04-12
Miyagi Tohoku University Fundamental Study on Suppression of Self-Interference Wave Caused by Intentional Information Leakage with IEMI
Riho Kawakami, Shugo Kaji (NAIST), Masahiro Kinugawa (NIT, Sendai College), Diasuke Fujimoto, Yu-ichi Hayashi (NAIST) HWS2019-6
There is a threat of information leakage through unintentional electromagnetic (EM) emissions from equipment. The feasib... [more] HWS2019-6
HWS, VLD 2019-02-28
Okinawa Okinawa Ken Seinen Kaikan Fundamental Study on Individual Identification Method of Electronic Device Using Difference of Radiation Spectrum Caused by Manufacturing/Mounting Variations
Shugo Kaji (NAIST), Masahiro kinugawa (NIT), Daisuke Fujimoto (NAIST), Laurent Sauvage, Jean-Luc Danger (Telecom ParisTech), Yu-ichi Hayashi (NAIST) VLD2018-120 HWS2018-83
There is a possibility that electronic devices which contain counterfeited/cloned ICs or electronic components cause ser... [more] VLD2018-120 HWS2018-83
EMCJ 2018-07-27
Tokyo Kikai-Shinko-Kaikan Bldg. Fundamental Study on Data Injection Attacks Using a Hardware Trojan against ICT Devices
Shugo Kaji (NAIST), Masahiro Kinugawa (NIT), Daisuke Fujimoto, Yu-ichi Hayashi (NAIST) EMCJ2018-30
Intentional electromagnetic interference (IEMI) is a threat to destroy integrated circuits (ICs) or elements by using hi... [more] EMCJ2018-30
MoNA, ASN, IPSJ-MBL, IPSJ-UBI [detail] 2018-02-27
Tokyo Sophia University Evaluating Network Capacity of Public Wi-Fi in Urban Area
Hiroki Iwasaki, Tatsuya Amano, Shugo Kajita, Hirozumi Yamaguchi, Teruo Higashino (Osaka Univ.), Mineo Takai (Osaka Univ./UCLA) MoNA2017-71
It is important to assess that public free Wi-Fi APs in urban areas can respond to users' need when deploying additional... [more] MoNA2017-71
MoNA, IPSJ-MBL, IPSJ-DPS 2015-05-29
Okinawa Miyakojima Marine Terminal Evaluation of the Algorithm for Estimating the Performance of WLAN Systems with Various Urban Scenarios
Shugo Kajita, Hirozumi Yamaguchi, Teruo Higashino (Osaka Univ.), Shigeki Umehara, Fumiya Saitou, Hirofumi Urayama, Masaya Yamada (Sumitomo Electric), Taka Maeno, Shigeru Kaneda (Space-Time Engineering), Mineo Takai (Space-Time Engineering/California Univ.) MoNA2015-5
This paper presents a method to estimate the performance of WLAN systems in urban areas.We consider (i) inter-channel in... [more] MoNA2015-5
 Results 1 - 12 of 12  /   
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