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All Technical Committee Conferences (Searched in: All Years)
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Search Results: Conference Papers |
Conference Papers (Available on Advance Programs) (Sort by: Date Descending) |
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Committee |
Date Time |
Place |
Paper Title / Authors |
Abstract |
Paper # |
ICD |
2015-04-16 13:50 |
Nagano |
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[Invited Lecture]
40 nm Dual-port and Two-port SRAMs for Automotive MCU Applications under the Wide Temperature Range of -40 to 170℃ with Test Screening Against Write Disturb Issues Yoshisato Yokoyama, Yuichiro Ishii, Tatsuya Fukuda, Yoshiki Tsujihashi, Atsushi Miyanishi (Renesas Electronics), Shinobu Asayama, Keiichi Maekawa, Kazutoshi Shiba (Renesas Semiconductor Manufacturing Corporation), Koji Nii (Renesas Electronics) ICD2015-3 |
(To be available after the conference date) [more] |
ICD2015-3 pp.9-14 |
ICD, SDM |
2014-08-05 10:50 |
Hokkaido |
Hokkaido Univ., Multimedia Education Bldg. |
40nm ultra-low leakage SRAM at 170 deg.C operation for embedded flash MCU Yoshisato Yokoyama, Yuichiro Ishii, Hidemitsu Kojima, Atsushi Miyanishi, Yoshiki Tsujihashi, Shinobu Asayama, Kazutoshi Shiba, Koji Tanaka, Tatsuya Fukuda, Koji Nii, Kazumasa Yanagisawa (Renesas) SDM2014-74 ICD2014-43 |
(To be available after the conference date) [more] |
SDM2014-74 ICD2014-43 pp.65-70 |
ICD |
2011-04-19 10:20 |
Hyogo |
Kobe University Takigawa Memorial Hall |
Multi-step Word-line Control Technology in Hierarchical Cell Architecture for Scaled-down High-density SRAMs Koichi Takeda, Toshio Saito, Shinobu Asayama, Yoshiharu Aimoto, Hiroyuki Kobatake, Shinya Ito, Toshifumi Takahashi, Kiyoshi Takeuchi, Masahiro Nomura, Yoshihiro Hayashi (Renesas Electronics) ICD2011-10 |
[more] |
ICD2011-10 pp.55-58 |
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