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All Technical Committee Conferences (Searched in: All Years)
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Search Results: Conference Papers |
Conference Papers (Available on Advance Programs) (Sort by: Date Descending) |
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Committee |
Date Time |
Place |
Paper Title / Authors |
Abstract |
Paper # |
EMT, IEE-EMT |
2023-11-10 11:10 |
Yamaguchi |
Kaikyo Messe Shimonoseki |
Simultaneous Learning Algorithm of Optical Linear Discriminant Filter and Neural Network
-- Application to the discrimination of fine three-dimensional defects on dielectric surfaces -- Shingo Shimada, Jun-ichiro Sugisaka, Koichi Hirayama, Takashi Yasui (Kitami Inst. Tech.) EMT2023-79 |
Various optical measurement methods using optical measurement technique and machine learning have been proposed to discr... [more] |
EMT2023-79 pp.91-95 |
EMT, IEE-EMT |
2023-05-19 15:30 |
Kanagawa |
Information Technology R & D Center, MITSUBISHI Electric Corp. |
Fine-Defect Discrimination on Dielectric Surface Using Optical Linear Discrimination Filter
-- Filter Design Algorithm for Measurement of Weak Scattered Light -- Shingo Shimada, Jun-ichiro Sugisaka, Koichi Hirayama, Takashi Yasui (Kitami Inst. Tech.) EMT2023-6 |
Various optical measurement methods have been proposed to rapidly discriminate convexity or concavity of the defect on t... [more] |
EMT2023-6 pp.27-32 |
EMT, IEE-EMT |
2022-11-17 10:00 |
Tokyo |
Kikai-Shinko-Kaikan Bldg. (Primary: On-site, Secondary: Online) |
Generalization capability improvement of fine-defect discrimination on dielectric surface using optical linear discrimination analysis filter with error detection Shingo Shimada, Jun-ichiro Sugisaka, Koichi Hirayama, Takashi Yasui (Kitami Inst. Tech.) EMT2022-53 |
Various optical measurement methods have been developed to precisely identify the defects on the surface of dielectric s... [more] |
EMT2022-53 pp.53-58 |
EMT, IEE-EMT |
2022-06-23 13:50 |
Tokyo |
The Institute of Electrical Engineers of Japan |
Shape tolerance analyes of three-dimensional fine-defect discrimination on dielectric surface using optical linear discrimination analysis Shingo Shimada, Jun-ichiro Sugisaka, Koichi Hirayama, Takashi Yasui (Kitami Inst.Tech.) EMT2022-5 |
Measurement of a fine defect on a dielectric substrate is difficult because the relationship between the defect shape an... [more] |
EMT2022-5 pp.25-30 |
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