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 Conference Papers (Available on Advance Programs)  (Sort by: Date Descending)
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Committee Date Time Place Paper Title / Authors Abstract Paper #
VLD, DC, IPSJ-SLDM, CPSY, RECONF, ICD, CPM
(Joint) [detail]
2015-12-01
13:50
Nagasaki Nagasaki Kinro Fukushi Kaikan Background Sequence Generation for Neighborhood Pattern Sensitive Fault Testing in Random Access Memories
Shin'ya Ueoka, Tomokazu Yoneda, Yuta Yamato, Michiko Inoue (NAIST)
The Neighborhood Pattern Sensitive Fault (NPSF) is widely discussed fault model for memories, and it occurs when a memor... [more] VLD2015-40 DC2015-36
pp.19-24
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