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Committee Date Time Place Paper Title / Authors Abstract Paper #
EMD, R 2013-02-15
13:35		 Mie Sumitomo Wiring System, Ltd Visualization of electric current in contact and effect of thin film on contact resistance
Shigeru Sawada, Shigeki Tsukiji (Mie Univ.), Shigeki Shimada (Sumitomo Electric Industries), Terutaka Tamai (Elcontech), Yasuhiro Hattori (ANTech) R2012-72 EMD2012-103		 The mathematical solutions and electrical field analysis results of current density distribution in electric contact hav... [more] R2012-72 EMD2012-103
pp.1-6
EMD 2011-11-18
08:45		 Akita Akita Univ. Tegata Campus Current Density Analysis in Contact Area by Using Light Emission Diode Wafer
Shigeru Sawada, Shigeki Tsukiji (Mie Univ.), Terutaka Tamai (ElconTech Consulting), Yasuhiro Hattori (Autonetworks Lab.) EMD2011-88		 In order to clarify the theory of contact resistance, there are many reports in these years. Mathematically the
constri... [more]		 EMD2011-88
pp.115-119
EMD, R 2011-02-18
13:30		 Shizuoka Shizuoka Univ. (Hamamatsu) Direct Viewing of Current in Contact Area used by Light Emission Diode
Shigeki Tsukiji, Shigeru Sawada, Terutaka Tamai (Mie Univ.), Yasuhiro Hattori (AN-Tech), Kazuo Iida (Mie Univ.) R2010-43 EMD2010-144		  [more] R2010-43 EMD2010-144
pp.7-12
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