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Committee Date Time Place Paper Title / Authors Abstract Paper #
ICD, ITE-IST 2009-10-01
10:00
Tokyo CIC Tokyo (Tamachi) Evaluation and Analysis of Substrate Noise in Microprocessor
Yoji Bando (Kobe Univ.), Daisuke Kosaka (A-R-Tec), Goichi Yokomizo, Kunihiko Tsuboi (STARC), Ying Shiun Li, Shen Lin (Apache), Makoto Nagata (Kobe Univ./A-R-Tec) ICD2009-35
An integrated power and substrate noise analysis environment targeting systems-on-chip (SoC) design was verified through... [more] ICD2009-35
pp.11-14
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