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 Conference Papers (Available on Advance Programs)  (Sort by: Date Descending)
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Committee Date Time Place Paper Title / Authors Abstract Paper #
VLD, DC, IPSJ-SLDM, CPSY, RECONF, ICD, CPM
(Joint) [detail]
2011-11-30
10:55
Miyazaki NewWelCity Miyazaki A study on path selection results of an adaptive field test with process variation and aging degradation for VLSI
Satoshi Kashiwazaki, Toshinori Hosokawa (Nihon Univ), Masayoshi Yoshimura (Kyu Univ) VLD2011-85 DC2011-61
It has the problem that good VLSIs in production testing become defective VLSIs in the fields because small delays on si... [more] VLD2011-85 DC2011-61
pp.191-195
DC 2011-06-24
14:00
Tokyo Kikai-Shinko-Kaikan Bldg. A study on path selection results of an adaptive field test with process variation and aging degradation for VLSI
Satoshi Kashiwazaki, Toshinori Hosokawa (Nihon Univ), Masayoshi Yoshimura (Kyuushu Univ) DC2011-10
It has the problem that good VLSIs in production testing become defective VLSIs in the fields because small delays on si... [more] DC2011-10
pp.11-16
DC 2011-02-14
11:00
Tokyo Kikai-Shinko-Kaikan Bldg. An Analysis of Critical Paths for Field Testing with Process Variation Consideration
Satoshi Kashiwazaki, Toshinori Hosokawa (Nihon Univ), Masayoshi Yoshimura (Kyushuu Univ) DC2010-61
Recently, it has the problem that good VLSIs in production testing become defective VLSIs in the fields because small de... [more] DC2010-61
pp.13-19
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