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All Technical Committee Conferences (Searched in: All Years)
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Search Results: Conference Papers |
Conference Papers (Available on Advance Programs) (Sort by: Date Descending) |
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Committee |
Date Time |
Place |
Paper Title / Authors |
Abstract |
Paper # |
EMD |
2013-11-17 09:40 |
Overseas |
Huazhong University of Science and Technology, Wuhan, P.R.China |
Time Variation of Contact Resistance after Contact of Silver Electrical Contacts Satoshi Ishikura, Junya Sekikawa (Shizuoka Univ.) EMD2013-105 |
he time variation of contact resistance of silver contacts is measured. The contacts are contacted at constant contact l... [more] |
EMD2013-105 pp.123-126 |
EMCJ, EMD |
2013-07-12 11:25 |
Tokyo |
Kikai-Shinko-Kaikan Bldg. |
The Time Variation of Contact Resistance of Electrical Contacts after Contacting on Constant Contact Force Satoshi Ishikura, Junya Sekikawa (Shizuoka University) EMCJ2013-41 EMD2013-26 |
The time variation of contact resistance of electrical contacts after contacting on constant contact force is reported. ... [more] |
EMCJ2013-41 EMD2013-26 pp.13-17 |
EMD |
2012-11-30 16:05 |
Chiba |
Chiba Institute of Technology |
Experimental Equipment for Measurement of Dependence of Contact Resistance on Contact Force Satoshi Ishikura, Junya Sekikawa (Shizuoka Univ.) EMD2012-74 |
[more] |
EMD2012-74 pp.59-63 |
ICD, SDM |
2008-07-17 10:30 |
Tokyo |
Kikai-Shinko-Kaikan Bldg. |
A 45 nm Low-Standby-Power Embedded SRAM with Improved Immunity Against Process and Temperature Variations Makoto Yabuuchi, Koji Nii, Yasumasa Tsukamoto, Shigeki Ohbayashi, Susumu Imaoka (Renesas Tech.), Yoshinobu Yamagami, Satoshi Ishikura, Toshio Terano, Katsuji Satomi, Hironori Akamatsu (Matsushita Elec.), Hirofumi Shinohara (Renesas Tech.) SDM2008-131 ICD2008-41 |
We develop 512 Kb SRAM module in 45 nm LSTP CMOS technology with the variation tolerant assist circuits against process ... [more] |
SDM2008-131 ICD2008-41 pp.17-22 |
ICD, SDM |
2007-08-24 16:05 |
Hokkaido |
Kitami Institute of Technology |
A 45nm 2port 8T-SRAM using hierarchical replica bitline technique with immunity from simultaneous R/W access issues Satoshi Ishikura, M. Kurumada, Toshio Terano, Yoshinobu Yamagami, Naoki Kotani, Katsuji Satomi (Matushita Electric Industrial), Koji Nii, Makoto Yabuuchi, Yasumasa Tsukamoto, Shigeki Ohbayashi, Toshiyuki Oashi, Hiroshi Makino, Hirofumi Shinohara (Renesas Technology), Hironori Akamatsu (Matushita Electric Industrial) SDM2007-168 ICD2007-96 |
We propose a new 2port SRAM with a 8T single-read-bitline (SRBL) memory cell for 45nm SOCs. Access time tends to be slow... [more] |
SDM2007-168 ICD2007-96 pp.145-148 |
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