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 Conference Papers (Available on Advance Programs)  (Sort by: Date Descending)
 Results 1 - 20 of 33  /  [Next]  
Committee Date Time Place Paper Title / Authors Abstract Paper #
EMCJ, EMD 2013-07-12
10:35
Tokyo Kikai-Shinko-Kaikan Bldg. Degradation Phenomenon of Electrical Contacts using a Hammering Oscillation Mechanism or a Micro-Sliding Mechanism -- A fundamental study on the performance of the hammering oscillation mechanism (28) --
Shin-ichi Wada, Keiji Koshida, Saindaa Norovling, Hiroaki Kubota (TMC), Koichiro Sawa (NIT) EMCJ2013-39 EMD2013-24
Authors have studied the effect on electrical contacts by actual micro-oscillation using the hammering oscillation mecha... [more] EMCJ2013-39 EMD2013-24
pp.1-6
EMD 2012-12-21
15:45
Tokyo Kikai-Shinko-Kaikan Bldg. Degradation Phenomenon of Electrical Contacts using hammering oscillating mechanism and micro-sliding mechanism -- A fundamental study on the performance of the hammering oscillating mechanism (26) --
Shin-ichi Wada, Keiji Koshida, Saindaa Norovling (TMC), Naoki Masuda (TCT), Kunio Yanagi, Hiroaki Kubota (TMC), Masashi Terasaki (TCT), Koichiro Sawa (NIT) EMD2012-95
Authors have studied the influence on electrical contacts by actual micro-oscillation using some oscillating mechanisms ... [more] EMD2012-95
pp.27-32
EMD 2012-12-01
14:30
Chiba Chiba Institute of Technology Degradation phenomenon of electrical contacts using a hammering oscillating mechanism -- A fundamental study on the performance of the oscillating mechanism (25) --
Shin-ichi Wada, Keiji Koshida, Saindaa Norovling, Naoki Masuda, Akira Ishiguro, Kunio Yanagi, Hiroaki Kubota (TMC System), Koichiro Sawa (Nippon Inst. of Tech.) EMD2012-86
Authors developed the mechanism which gives real vibration to electrical contacts by hammering oscillation in the vertic... [more] EMD2012-86
pp.125-131
EMCJ, EMD 2012-07-20
12:50
Tokyo Kikai-Shinko-Kaikan Bldg. Degradation phenomenon of electrical contacts using hammering oscillating mechanism and micro-sliding mechanism -- A fundamental study on the performance of the oscillating mechanism (23) --
Shin-ichi Wada, Keiji Koshida, Saindaa Norovling, Kouki Takeda, Naoki Masuda, Kunio Yanagi, Hiroaki Kubota (TMC), Koichiro Sawa (NIT) EMCJ2012-41 EMD2012-16
Authors have studied the influence on contact resistance by actual micro-oscillation to electrical contacts using some o... [more] EMCJ2012-41 EMD2012-16
pp.1-6
EMCJ, EMD 2012-07-20
13:15
Tokyo Kikai-Shinko-Kaikan Bldg. Degradation Phenomenon of Electrical Contacts using some Oscillating Mechanisms -- Modeling about Fluctuation of Contact Resistance (24) --
Shin-ichi Wada, Keiji Koshida, Saindaa Norovling, Naoki Masuda, Akira Ishiguro, Kunio Yanagi, Hiroaki Kubota (TMC), Koichiro Sawa (NIT) EMCJ2012-42 EMD2012-17
Authors have developed some mechanisms which give real vibration to electrical contacts and studied the influences of a ... [more] EMCJ2012-42 EMD2012-17
pp.7-12
EMD, CPM, OME 2012-06-22
17:25
Tokyo Kikai-Shinko-Kaikan Bldg. Degradation phenomenon of electrical contacts using hammering oscillating mechanism and micro-sliding mechanism -- A fundamental study on the performance of the oscillating mechanism(22) --
Shin-ichi Wada, Keiji Koshida, Saindaa Norovling, Naoki Masuda, Akira Ishiguro, Kunio Yanagi, Hiroaki Kubota (TMC), Koichiro Sawa (NIT) EMD2012-15 CPM2012-32 OME2012-39
Authors have studied the influence on contact resistance by actual micro-oscillation to electrical contacts using some o... [more] EMD2012-15 CPM2012-32 OME2012-39
pp.41-46
EMD 2012-05-25
14:20
Miyagi Tohoku Bunka Gakuen Univ. Degradation phenomenon of electrical contacts using hammering oscillating mechanism and micro-sliding mechanism -- Contact Resistance and its Model (21) --
Shin-ichi Wada, Keiji Koshida, Saindaa Norovling, Naoki Masuda, Akira Ishiguro, Kunio Yanagi, Hiroaki Kubota (TMC), Koichiro Sawa (NIT) EMD2012-3
Authors have studied the influence on contact resistance by actual micro-oscillation to electrical contacts using some o... [more] EMD2012-3
pp.13-18
EMD 2012-01-20
13:35
Kanagawa   Degradation phenomenon of electrical contacts using hammering oscillating mechanism and micro-sliding mechanism -- Contact Resistance and its model (20) --
Shin-ichi Wada, Keiji Koshida, Masahiro Kawanobe, Saindaa Norovling, Naoki Masuda, Akira Ishiguro, Kunio Yanagi, Hiroaki Kubota (TMC), Koichiro Sawa (NIT) EMD2011-112
Authors have studied the influence on contact resistance by actual micro-oscillation to electrical contacts using some o... [more] EMD2011-112
pp.1-6
EMD 2011-12-16
13:55
Tokyo NIT Kanda Camps Degradation phenomenon of electrical contacts using hammering oscillating mechanism and micro-sliding mechanism -- Contact Resistance and its model (19) --
Shin-ichi Wada, Saindaa Norovling, Keiji Koshida, Masahiro Kawanobe, Naoki Masuda, Hiroaki Kubota (TMC), Koichiro Sawa (NIT) EMD2011-108
Authors have studied the influence on contact resistance by actual micro-oscillation to electrical contacts using some o... [more] EMD2011-108
pp.11-16
EMD 2011-11-18
16:15
Akita Akita Univ. Tegata Campus Degradation Phenomenon of Electrical Contacts using a Micro-Sliding Mechanism -- Minimal Sliding Amplitudes estimated under some conditions by the Mechanism (18) --
Shin-ichi Wada, Keiji Koshida, Masahiro Kawanobe, Saindaa Norovling, Naoki Masuda, Akira Ishiguro, Kunio Yanagi, Hiroaki Kubota (TMC System), Koichiro Sawa (Nippon Inst. of Tech.) EMD2011-102
Authors have developed the mechanism which gives damping vibration to electrical contacts by the reciprocal hammering-os... [more] EMD2011-102
pp.189-194
EMD 2011-10-21
12:35
Tokyo Tachikawa-Shiminn-kaikan Degradation Phenomenon of Electrical Contacts by hammering Oscillating mechanism and micro-sliding mechanism -- Contact Resistance (17) --
Shin-ichi Wada, Keiji Koshida, Masahiro Kawanobe, Saindaa Norovling, Naoki Masuda, Akira Ishiguro, Kunio Yanagi, Hiroaki Kubota (TMC), Koichiro Sawa (NIT) EMD2011-57
Authors have studied the influence on contact resistance by actual micro-oscillation to electrical contacts using some o... [more] EMD2011-57
pp.1-6
EMD, EMCJ 2011-07-15
12:20
Tokyo Kikai-Shinko-Kaikan Bldg. Degradation phenomenon of electrical contacts by hammering oscillating mechanism and micro-sliding mechanism -- Contact resistance (16) --
Shin-ichi Wada, Keiji Koshida, Masahiro Kawanobe, Saindaa Norovling, Naoki Masuda, Akira Ishiguro, Kunio Yanagi, Hiroaki Kubota (TMC), Koichiro Sawa (NIT) EMCJ2011-61 EMD2011-20
Authors have studied the influence on contact resistance by actual micro-oscillation to electrical contacts using some o... [more] EMCJ2011-61 EMD2011-20
pp.1-6
EMD, EMCJ 2011-07-15
12:45
Tokyo Kikai-Shinko-Kaikan Bldg. Degradation Phenomenon of Electrical Contacts by a Tapping Device -- A tapping device for trial (3) --
Shin-ichi Wada, Keiji Koshida, Saindaa Norovling, Masahiro Kawanobe, Koki Takeda, Daiki Ishizuka, Kunio Yanagi, Hiroaki Kubota (TMC), Nobuhiro Kuga (YNU), Koichiro Sawa (NIT) EMCJ2011-62 EMD2011-21
Authors have developed and made a handy “tapping device (TPD)” experimentally without a special stage for the inspection... [more] EMCJ2011-62 EMD2011-21
pp.7-12
EMD 2011-05-20
15:50
Miyagi Tohoku Univ. Cyber-Science Center Degrdation phenomenon of electrical contacts using hammering oscillating mechanism and micro-sliding mechanism -- Contact resistance --
Shin-ichi Wada, Saindaa Norovling, Keiji Koshida, Masahiro Kawanobe, Hiroaki Kubota (TMC), Koichiro Sawa (NIT) EMD2011-7
Authors have studied the influence on contact resistance by micro-oscillation to electrical contacts using hammering osc... [more] EMD2011-7
pp.33-38
NLP 2011-03-11
16:35
Tokyo Tokyo University of Science A Study of Degradatuion Phenomenon of electrical Contacts by some Oscillating Mechanisms -- Modeling about Fluctuation of Contact Resistance --
Shin-ichi Wada, Keiji Koshida, Saindaa Norovling, Masahiro Kawanobe, Masayoshi Kotabe, Hiroaki Kubota (TMC), Tohru Ikeguchi (Saitama Univ.), Yoshihiko Horio (Tokyo Denki Univ.), Koichiro Sawa (Nippon Insti. of Tech.) NLP2010-196
The authors have developed some mechanisms which give real vibration to electrical contacts and studied the influences o... [more] NLP2010-196
pp.187-192
EMD 2011-01-28
15:40
Tokyo Japan Aviation Electronics Industry,Limited Degradation phenomenon of electrical contacts by a tapping device -- A tapping device for trial (1) --
Shin-ichi Wada, Keiji Koshida, Saindaa Norovling, Masahiro Kawanobe, Daiki Ishizuka, Kunio Yanagi, Masayoshi Kotabe, Hiroaki Kubota (TMC), Nobuhiro Kuga (Yokohama Nat'l Univ.), Koichiro Sawa (NIT) EMD2010-141
Authors have studied the influence on electrical contact resistance by external micro-oscillation using a hammering osci... [more] EMD2010-141
pp.35-40
EMD 2011-01-28
16:05
Tokyo Japan Aviation Electronics Industry,Limited Degradation phenomenon of electrical contacts by a tapping device -- A tapping device for trial (2) --
Keiji Koshida, Shin-ichi Wada, Saindaa Norovling, Masahiro Kawanobe, Masayoshi Kotabe, Hiroaki Kubota (TMC), Nobuhiro Kuga (Yokohama Nat'l Univ.), Koichiro Sawa (NIT) EMD2010-142
Authors have developed and made a handy "tapping device (TPD)" experimentally without a special stage for the inspection... [more] EMD2010-142
pp.41-46
EMD 2010-12-17
14:30
Tokyo Tamagawa University Degradation phenomenon of electrical contacts by hammering oscillating mechanism -- Contact Resistance (14) --
Shin-ichi Wada, Saindaa Norovling, Keiji Koshida, Masahiro Kawanobe, Masayoshi Kotabe, Hiroaki Kubota (TMC), Koichiro Sawa (Professor Emeritus Keio Univ/Nippon Inst. of Tech.) EMD2010-132
Authors have studied the influence on contact resistance by micro-oscillation to electrical contacts using hammering osc... [more] EMD2010-132
pp.17-22
EMD 2010-11-12
13:15
Overseas Xi'an Jiaotong University A study of Degradation Phenomenon of Electrical Contacts by Hammering Oscillating Mechanism -- Modeling (10) --
Shin-ichi Wada, Keiji Koshida, Saindaa Norovling, Masayoshi Kotabe, Hiroaki Kubota (TMC System), Koichiro Sawa (Nippon Inst. of Tech.) EMD2010-111
A mechanism which contributes oscillation toward electrical contacts by hammering oscillation mechanism (HOM) in the ver... [more] EMD2010-111
pp.185-188
EMD 2010-10-15
14:35
Tokyo NTT Musashino Research and Development Center Degradation phenomenon of electrical contacts by hammering oscillating mechanism -- Contact Resistance (13) --
Shin-ichi Wada, Keiji Koshida, Saindaa Norovling, Masayoshi Kotabe, Hiroaki Kubota (TMC), Koichiro Sawa (NIT) EMD2010-65
Authors measured increasing resistances on electrical contacts by means of sliding contact mechanism respectively on the... [more] EMD2010-65
pp.13-18
 Results 1 - 20 of 33  /  [Next]  
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