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Committee Date Time Place Paper Title / Authors Abstract Paper #
VLD, DC, IPSJ-SLDM, CPSY, RECONF, ICD, CPM
(Joint) [detail]
2010-12-01
11:25
Fukuoka Kyushu University A Sequential Test Generation Method and a Binding Method for Testability Using Behavioral Description
Ryoichi Inoue, Hiroaki Fujiwara, Toshinori Hosokawa (Nihon Univ.), Hideo Fujiwara (NAIST) VLD2010-76 DC2010-43
Although many works on test generation algorithms for sequential circuits have been reported so far, it is still very ha... [more] VLD2010-76 DC2010-43
pp.143-148
DC 2008-02-08
15:15
Tokyo Kikai-Shinko-Kaikan Bldg. A Test Generation Methods for State Observable FSMs to Increase Defect Coverage Under Test Length Constraint
Ryoichi Inoue, Toshinori Hosokawa (Nihon Univ.), Hideo Fujiwara (NAIST) DC2007-78
We proposed a fault-independent test generation method for logical fault testing of state-observable FSMs and a fault-de... [more] DC2007-78
pp.69-76
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