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Committee Date Time Place Paper Title / Authors Abstract Paper #
SDM 2019-10-24
13:00		 Miyagi Niche, Tohoku Univ. [Invited Talk] Random nanostructure formation and electric readout for nano-artifact metrics
Seiya Kasai, Renpeng Lu, Katsumi Shimizu, Xiang Yin (Hokkaido Univ.), Yosuke Ueba, Mikio Ishikawa, Mitsuru Kitamura (DNP), Morihisa Hoga (AIST), Makoto Naruse (Univ. of Tokyo), Tsutomu Matsumoto (YNU) SDM2019-62		 We introduce a basic concept of nano-artifact metrics, expected to be a highly secure authentication technique using nan... [more] SDM2019-62
pp.45-50
SDM, ED, CPM 2019-05-17
11:10		 Shizuoka Shizuoka Univ. (Hamamatsu) Experimental Study on Optimization of 2D Random Nanostructure Formation and Electrical Readout for Nano Artifact Metrics
Renpeng Lu, Katsumi Shimizu, Xiang Yin (Hokkaido Univ.), Yosuke Ueba, Mikio Ishikawa, Mitsuru Kitamura (DNP), Seiya Kasai (Hokkaido Univ.) ED2019-24 CPM2019-15 SDM2019-22		 For nano-artifact metrics utilizing resist collapse in nanometer-scale electron beam lithography, we investigate lithogr... [more] ED2019-24 CPM2019-15 SDM2019-22
pp.67-70
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