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Committee Date Time Place Paper Title / Authors Abstract Paper #
VLD 2008-09-29
13:30		 Ishikawa   [Invited Talk] Phase-Adjustable Error Detection Flip-Flops with 2-Stage Hold Driven Optimization and Slack Based Grouping Scheme for Dynamic Voltage Scaling
Masanori Kurimoto, Hiroaki Suzuki (Renesas Technology), Rei Akiyama, Tadao Yamanaka, Haruyuki Okuma (Renesas Design), Hidehiro Takata, Hirofumi Shinohara (Renesas Technology) VLD2008-47		  [more] VLD2008-47
pp.1-6
ICD, SDM 2007-08-24
08:55		 Hokkaido Kitami Institute of Technology Fine-Grained In-Circuit Continuous-Time Probing Technique of Dynamic Supply Variation in SoCs
Mitsuya Fukazawa, Tetsuro Matsuno, Toshifumi Uemura (Kobe Univ.), Rei Akiyama (Renesas Design), Tetsuya Kagemoto, Hiroshi Makino, Hidehiro Takata (Renesas Technology), Makoto Nagata (Kobe Univ.) SDM2007-156 ICD2007-84		 Fine-grained built-in probing circuits are distributed at 120 locations on the SoC to allow continuous-time monitoring o... [more] SDM2007-156 ICD2007-84
pp.85-90
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