|
|
All Technical Committee Conferences (Searched in: All Years)
|
|
Search Results: Conference Papers |
Conference Papers (Available on Advance Programs) (Sort by: Date Descending) |
|
Committee |
Date Time |
Place |
Paper Title / Authors |
Abstract |
Paper # |
ICD, SDM |
2007-08-23 15:25 |
Hokkaido |
Kitami Institute of Technology |
A 1.92us-wake-up time thick-gate-oxide power switch technique for ultra low-power single-chip mobile processors Kazuki Fukuoka, Osamu Ozawa, Ryo Mori, Yasuto Igarashi, Toshio Sasaki, Takashi Kuraishi, Yoshihiko Yasu, Koichiro Ishibashi (Renesas Technology) SDM2007-153 ICD2007-81 |
A technique for controlling rush current and wake-up time of thick-gate-oxide power switches is described. Suppressing t... [more] |
SDM2007-153 ICD2007-81 pp.69-73 |
ICD, ITE-CE |
2006-12-15 11:15 |
Hiroshima |
|
Low Power SOC Design using Partial-Trench-Isolation ABC SOI for sub-100-nm LSTP technology Osamu Ozawa, Kazuki Fukuoka, Yasuto Igarashi, Takashi Kuraishi, Yoshihiko Yasu, Yukio Maki, Takashi Ipposhi, Toshihiko Ochiai, Masayoshi Shirahata, Koichiro Ishibashi (Renesas) |
[more] |
ICD2006-163 pp.115-119 |
|
|
|
Copyright and reproduction :
All rights are reserved and no part of this publication may be reproduced or transmitted in any form or by any means, electronic or mechanical, including photocopy, recording, or any information storage and retrieval system, without permission in writing from the publisher. Notwithstanding, instructors are permitted to photocopy isolated articles for noncommercial classroom use without fee. (License No.: 10GA0019/12GB0052/13GB0056/17GB0034/18GB0034)
|
[Return to Top Page]
[Return to IEICE Web Page]
|