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 Conference Papers (Available on Advance Programs)  (Sort by: Date Descending)
 Results 1 - 6 of 6  /   
Committee Date Time Place Paper Title / Authors Abstract Paper #
SDM 2023-11-10
11:20		 Tokyo
(Primary: On-site, Secondary: Online)		 [Invited Talk] Self-Consistent Monte Carlo Device Simulation of Capture-Excitation Processes of Carriers
Futo Hashimoto, Toma Suzuki, Hideki Minari, Nobuya Nakazaki, Jun Komachi (Sony Semiconductor Solutions), Nobuyuki Sano (Univ. of Tsukuba) SDM2023-69		 The capture-excitation processes of carriers are implemented in self-consistent Monte Carlo device simulations. The car... [more] SDM2023-69
pp.31-34
SDM 2019-11-08
10:30		 Tokyo Kikai-Shinko-Kaikan Bldg. [Invited Talk] Fundamental Aspects of Semiconductor Device Modeling Associated with Discrete Impurities II -- Random Dopants under Semiconductor Nano-structures --
Nobuyuki Sano (Univ. Tsukuba) SDM2019-75		 Theoretical modeling of discrete impurities under the framework of device simulations plays a crucial role in analyzing ... [more] SDM2019-75
pp.33-38
SDM 2017-11-10
11:00		 Tokyo Kikai-Shinko-Kaikan Bldg. [Invited Talk] Fundamental Aspects of Semiconductor Device Modeling associated with Discrete Impurities -- Random Dopant Fluctuations and Self-Averaging --
Nobuyuki Sano (Univ. Tsukuba) SDM2017-68		 The classical and quantum effects associated with discrete impurities on transport characteristics and device modeling i... [more] SDM2017-68
pp.37-42
SDM 2016-11-11
15:40		 Tokyo Kikai-Shinko-Kaikan Bldg. Self-Consistent Monte Carlo Device Simulations Under Double-Gate Device Structures
Hajime Sakamoto, Yasuaki Rokugo, Nobuyuki Sano (Tsukuba univ.) SDM2016-88		 We examine the effect of long-range Coulomb interaction on the double-gate MOSFET by using the self-consistent 3D Monte ... [more] SDM2016-88
pp.55-58
SDM 2016-11-11
16:05		 Tokyo Kikai-Shinko-Kaikan Bldg. Self-Consistent Device Simulation of a-Si p-i-n Solar Cells and Physical Mechanism of Capture and Emission Processes
Azuma Suzuki (Tsukuba Univ.), Katsuhisa Yoshida (Tokyo Univ.), Nobuyuki Sano (Tsukuba Univ.) SDM2016-89		 (To be available after the conference date) [more] SDM2016-89
pp.59-64
SDM 2013-11-15
13:00		 Tokyo Kikai-Shinko-Kaikan Bldg. NEGF Simulation for Studying Effect of Screening and Impurity Scattering in Junctionless Transistors
Akiko Ueda (Univ. of Tsukuba), Mathieu Luisier (ETH Zurich), Katsuhisa Yoshida, Syuta Honda, Nobuyuki Sano (Univ. of Tsukuba) SDM2013-110		 We examine the low field mobility in the presence of the ionized impurity scattering of highly-doped n-type junctionless... [more] SDM2013-110
pp.61-64
 Results 1 - 6 of 6  /   
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