IEICE Technical Committee Submission System
Conference Schedule		 Online Proceedings
[Sign in]
Tech. Rep. Archives
    [Japanese] / [English] 
( Committee/Place/Topics  ) --Press->
 
( Paper Keywords:  /  Column:Title Auth. Affi. Abst. Keyword ) --Press->

All Technical Committee Conferences  (Searched in: All Years)

Search Results: Conference Papers
 Conference Papers (Available on Advance Programs)  (Sort by: Date Descending)
 Results 1 - 5 of 5  /   
Committee Date Time Place Paper Title / Authors Abstract Paper #
LQE, CPM, EMD, OPE, R 2012-08-23
14:15		 Miyagi Tohoku Univ. Improvement in reliability of AlGaInAs edge-emitting laser diodes
Hiroyuki Ichikawa, Yasuo Yamasaki, Nobuyuki Ikoma (SEI) R2012-27 EMD2012-33 CPM2012-58 OPE2012-65 LQE2012-31		 High-speed and high-temperature operations are required for light emitters in optical communication systems. AlGaInAs la... [more] R2012-27 EMD2012-33 CPM2012-58 OPE2012-65 LQE2012-31
pp.33-36
LQE, OPE, OCS 2010-10-29
15:30		 Fukuoka Mojiko Retro Town, Minato house High Reliable AlGaInAs Lasers by Improved Facet-Coating Processes
Hiroyuki Ichikawa, Chie Fukuda, Shinji Matsukawa, Nobuyuki Ikoma (SEI) OCS2010-83 OPE2010-119 LQE2010-92		 AlGaInAs lasers are suitable for element devices of optical communication systems. However, degradations in forward-bias... [more] OCS2010-83 OPE2010-119 LQE2010-92
pp.157-162
CPM, OPE, R 2010-04-16
14:50		 Tokyo Kikai-Shinko-Kaikan Bldg. Reduction in Facet Temperature of AlGaInAs Edge-Emitting Lasers
Hiroyuki Ichikawa, Nobuyuki Ikoma (SEI) R2010-4 CPM2010-4 OPE2010-4		 AlGaInAs edge-emitting lasers have been expected for element devices for optical communication systems. However, increas... [more] R2010-4 CPM2010-4 OPE2010-4
pp.17-22
LQE 2009-12-11
11:00		 Tokyo Kikai-Shinko-Kaikan Bldg. Relationship between Facet Stress and Reliability of Edge-Emitting AlGaInAs Laser Diodes
Hiroyuki Ichikawa, Akiko Kumagai, Naoya Kono, Shinji Matsukawa, Chie Fukuda, Keiko Iwai, Nobuyuki Ikoma (Sumitomo Electric Industries, Ltd.) LQE2009-142		 Although facet stress is one of the important parameters in edge-emitting laser diodes (LDs), the relationship between f... [more] LQE2009-142
pp.19-23
OPE, CPM, R 2009-04-17
13:40		 Tokyo Kikai-Shinko-Kaikan Bldg. Electrostatic-Discharge Tolerance of AlGaInAs Laser Diodes
Hiroyuki Ichikawa, Chie Fukuda, Shinji Matsukawa, Kotaro Hamada, Nobuyuki Ikoma, Takashi Nakabayashi (Sumitomo Electric Industries, Ltd.) R2009-2 CPM2009-2 OPE2009-2		 This is a report on electrostatic discharge (ESD)-induced degradation of AlGaInAs/InP laser diodes. We found that the do... [more] R2009-2 CPM2009-2 OPE2009-2
pp.7-10
 Results 1 - 5 of 5  /   
Choose a download format for default settings. [NEW !!]
Text format pLaTeX format CSV format BibTeX format
Copyright and reproduction : All rights are reserved and no part of this publication may be reproduced or transmitted in any form or by any means, electronic or mechanical, including photocopy, recording, or any information storage and retrieval system, without permission in writing from the publisher. Notwithstanding, instructors are permitted to photocopy isolated articles for noncommercial classroom use without fee. (License No.: 10GA0019/12GB0052/13GB0056/17GB0034/18GB0034)

[Return to Top Page]

[Return to IEICE Web Page]
The Institute of Electronics, Information and Communication Engineers (IEICE), Japan