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All Technical Committee Conferences (Searched in: All Years)
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Search Results: Conference Papers |
Conference Papers (Available on Advance Programs) (Sort by: Date Descending) |
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Committee |
Date Time |
Place |
Paper Title / Authors |
Abstract |
Paper # |
DC |
2010-06-25 14:00 |
Tokyo |
Kikai-Shinko-Kaikan Bldg. |
A Class of Partial Thru Testable Sequential Circuits with Multiplexers Nobuya Oka, Yuki Yoshikawa, Hideyuki Ichihara, Tomoo Inoue (Hiroshima City Univ.) DC2010-9 |
Partially thru testable sequential circuits are known to be practically testable, and a condition for the testable seque... [more] |
DC2010-9 pp.7-11 |
VLD, CPSY, RECONF, DC, IPSJ-SLDM, IPSJ-ARC (Joint) [detail] |
2007-11-20 10:55 |
Fukuoka |
Kitakyushu International Conference Center |
An optimization of thru trees for test generation based on acyclical testability Kohsuke Morinaga, Nobuya Oka, Yuki Yoshikawa, Hideyuki Ichihara, Tomoo Inoue (Hiroshima City Univ.) VLD2007-72 DC2007-27 |
The class of acyclic sequential circuits is $\tau^2$-bounded, i.e., acyclic sequential circuits are practically easily t... [more] |
VLD2007-72 DC2007-27 pp.13-18 |
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