Committee |
Date Time |
Place |
Paper Title / Authors |
Abstract |
Paper # |
SDM |
2014-02-28 10:10 |
Tokyo |
Kikai-Shinko-Kaikan Bldg. |
[Invited Talk]
Trend of practical technology in advanced low-k integration Naoya Inoue (Renesas Electronics Corp.) SDM2013-166 |
Looking at the trend in Cu/Low-k interconnect technology, integration issues and solutions are discussed from the viewpo... [more] |
SDM2013-166 pp.7-12 |
OFT |
2013-01-25 09:00 |
Tokushima |
|
Fabrication of polarization-maintaining photonic crystal fiber optical attenuator using air hole diameter control Hirohisa Yokota, Naoya Inoue, Yuto Kobayashi, Yoh Imai (Ibaraki Univ.) OFT2012-62 |
Photonic crystal fiber (PCF) optical attenuators that are fabricated by air hole diameter control have advantages such a... [more] |
OFT2012-62 pp.51-54 |
IBISML |
2012-11-07 15:30 |
Tokyo |
Bunkyo School Building, Tokyo Campus, Tsukuba Univ. |
Online Large-margin Weight Learning for First-order Logic-based Abduction Naoya Inoue, Kazeto Yamamoto, Yotaro Watanabe, Naoaki Okazaki, Kentaro Inui (Tohoku Univ.) IBISML2012-54 |
Abduction is inference to the best explanation. Abduction has long been studied in a wide range of contexts and is widel... [more] |
IBISML2012-54 pp.143-150 |
SDM |
2012-03-05 10:50 |
Tokyo |
Kikai-Shinko-Kaikan Bldg. |
Basic Performance of a Logic-IP Compatible eDRAM with Cylinder Capacitors in Low-k/Cu BEOL Layers Ippei Kume, Naoya Inoue, Ken'ichiro Hijioka, Jun Kawahara, Koichi Takeda, Naoya Furutake, Hiroki Shirai, Kenya Kazama, Shin'ichi Kuwabara, Msasatoshi Watarai, Takashi Sakoh, Toshifumi Takahashi, Takashi Ogura, Toshiji Taiji, Yoshiko Kasama (Renesas Electronics) SDM2011-177 |
We have confirmed the basic performance of a Logic-IP compatible (LIC) eDRAM with cylinder capacitors in the low-k/Cu BE... [more] |
SDM2011-177 pp.7-11 |
SDM |
2012-03-05 11:20 |
Tokyo |
Kikai-Shinko-Kaikan Bldg. |
Highly Reliable BEOL-Transistor with oxygen-controlled InGaZnO channel and Gate/Drain Offset design Kishou Kaneko, Naoya Inoue, Shinobu Saito, Naoya Furutake, Hiroshi Sunamura, Jun Kawahara, Masami Hane, Yoshihiro Hayashi (Renesas Electronics) SDM2011-178 |
Reliability of BEOL-transistors with a wide-gap oxide semiconductor InGaZnO film for high-voltage interface, integrated ... [more] |
SDM2011-178 pp.13-17 |
SDM |
2011-02-07 10:50 |
Tokyo |
Kikai-Shinko-Kaikan Bldg. |
Path-finding for Integration of Robust Low-k (k-2.5) SiOCH in System LSI Naoya Inoue, Makoto Ueki, Hironori Yamamoto, Ippei Kume, Jun Kawahara, Manabu Iguchi, Hirokazu Honda, Yoshitaka Horikoshi, Yoshihiro Hayashi (Renesas Electronics Corp.) SDM2010-217 |
Impacts of k-value reduction on LSI performances are clarified quantitatively using 2M-gate net-list. Reduction in k-val... [more] |
SDM2010-217 pp.7-12 |
IBISML |
2010-11-05 15:30 |
Tokyo |
IIS, Univ. of Tokyo |
[Poster Presentation]
SVM with weight learning for kernel parameters of each sample Naoya Inoue, Yukihiko Yamashita (TOKYO TECH) IBISML2010-95 |
In the support vector machine (SVM) with an asymmetric kernel function, two mappings in the inner product to a high-dime... [more] |
IBISML2010-95 pp.265-270 |
OFT |
2010-10-25 15:05 |
Saitama |
Nippon Institute of Technology |
Fabrication of Photonic Crystal Fiber Attenuator with Air Hole Diameter Control Using CO2 Laser Irradiation Hirohisa Yokota, Kousuke Ushiroda, Naoya Inoue, Yoh Imai, Yutaka Sasaki (Ibaraki Univ.) OFT2010-34 |
Photonic crystal fiber (PCF) attenuators with air hole diameter control were fabricated by PCF fusion using CO_2 laser i... [more] |
OFT2010-34 pp.29-32 |
SDM |
2010-02-05 10:50 |
Tokyo |
Kikai-Shinko-Kaikan Bldg. |
Highly-Reliable Cu Interconnect covered with CoWB Metal-cap in a Waterproof Molecular-Pore-Stack (MPS)-SiOCH film Yoshihiro Hayashi, Masayoshi Tagami, Naoya Furutake, Naoya Inoue, Emiko Nakazawa, Kouji Arita (NEC Electronics) SDM2009-183 |
A new low-power copper (Cu) interconnect structure is developed with selective-metal (CoWB) cap, which selectively cover... [more] |
SDM2009-183 pp.7-11 |
SDM |
2010-02-05 15:45 |
Tokyo |
Kikai-Shinko-Kaikan Bldg. |
Defects in Cu/low-k Interconnects Probed Using Monoenergetic Positron Beams Akira Uedono (Tsukuba Univ.), Naoya Inoue, Y. Hayashi, K. Eguchi, T. Nakamura, Y. Hirose, Masaki Yoshimaru (STARC), Nagayasu Oshima, Toshiyuki Ohdaira, R. Suzuki (National Institute of Advanced Industrial Science and Technology) SDM2009-190 |
Defects in SiOCH/Cu damascene structures were probed using monoenergetic positron beams. Doppler broadening spectra of t... [more] |
SDM2009-190 pp.49-52 |
EA |
2006-03-13 11:00 |
Tokyo |
|
Estimation of sound source direction based on statistical model Naoya Inoue, Takanori Nishino, Katsunobu Itou, Kazuya Takeda (Nagoya Univ.) |
[more] |
EA2005-108 pp.23-28 |