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All Technical Committee Conferences (Searched in: All Years)
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Search Results: Conference Papers |
Conference Papers (Available on Advance Programs) (Sort by: Date Descending) |
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Committee |
Date Time |
Place |
Paper Title / Authors |
Abstract |
Paper # |
EMCJ, WPT (Joint) |
2015-01-22 11:00 |
Okinawa |
Okinawaken Jichikaikan |
Susceptibility Characteristics of Transmission Line in BCI test Naoki Takata (Tokai Univ.), Yoshio Kami, Fengchao Xiao (UEC), Majid Tayarani (IUST), Kimitoshi Murano (Tokai Univ.) EMCJ2014-84 |
Recently, the Bulk current injection (BCI) test is conducted to evaluate the immunity of an electronic equipment under a... [more] |
EMCJ2014-84 pp.1-4 |
SDM, OME |
2008-04-12 11:00 |
Okinawa |
Okinawa Seinen Kaikan |
Microstructural Analysis of Polycrystalline Silicon Thin Films Formation Behavior during Aluminum Induced Crystallization Ken-ichi Ikeda (Kyushu Univ.), Takeshi Hirota (Mitsubishi Heavy Industries Ltd.), Kensuke Fujimoto (Kyushu Univ.), Youhei Sugimoto (Seiko Epson Corp.), Naoki Takata (Tokyo Inst. Tech.), Seiichiro Ii (Sojo Univ.), Hideharu Nakashima, Hiroshi Nakashima (Kyushu Univ.) SDM2008-19 OME2008-19 |
The formation behavior of polycrystalline silicon thin films during the aluminum induced crystallization (AIC) was inves... [more] |
SDM2008-19 OME2008-19 pp.95-100 |
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