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 Conference Papers (Available on Advance Programs)  (Sort by: Date Descending)
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Committee Date Time Place Paper Title / Authors Abstract Paper #
SDM 2018-10-18
13:30		 Miyagi Niche, Tohoku Univ. Process Evaluation of Si Nanowire for Thermoelectric Device by Raman Spectroscopy
Ryo Yokogawa (Meiji Univ.), Motohiro Tomita, Takanobu Watanabe (Waseda Univ.), Atsushi Ogura (Meiji Univ.) SDM2018-61		 Silicon nanowire (SiNW) is expected to be a new attractive thermoelectric material with excellent performance with low t... [more] SDM2018-61
pp.47-50
ED, SDM 2017-02-24
16:45		 Hokkaido Centennial Hall, Hokkaido Univ. Reproduce and Prediction of Phonon in Group IV Binary Alloy Semiconductors by Lattice Dynamics Simulation
Motohiro Tomita (Waseda Univ./Meiji Univ./JSPS), Atsushi Ogura (Meiji Univ.), Takanobu Watanabe (Waseda Univ.) ED2016-141 SDM2016-158		 We have developed the interatomic potential of SiGe, GeSn, and SiSn binary mixed systems to reproduce the lattice consta... [more] ED2016-141 SDM2016-158
pp.61-66
SDM 2010-10-21
14:00		 Miyagi Tohoku University [Invited Talk] Channel strain evaluation for advanced LSI
Atsushi Ogura, Daisuke Kosemura, Munehisa Takei, Motohiro Tomita (Meiji Univ.) SDM2010-152		  [more] SDM2010-152
pp.1-6
SDM 2010-10-22
16:20		 Miyagi Tohoku University Strain evaluation in Si at atomically flat SiO2/Si interface
Maki Hattori (Meiji Univ.), Daisuke Kosemura (Meiji Univ./JSPS), Munehisa Takei, Kohki Nagata, Hiroaki Akamatsu, Motohiro Tomita, Yuuki Mizukami, Yuuki Hashiguchi, Takuya Yamaguchi, Atsushi Ogura (Meiji Univ.), Tomoyuki Suwa, Akinobu Teramoto, Takeo Hattori, Tadahiro Ohmi (NICHe), Tomoyuki Koganezawa (JASRI) SDM2010-170		 We performed Raman spectroscopy and in-plane XRD measurement to clarify the structure and strain in Si at and near an at... [more] SDM2010-170
pp.71-75
 Results 1 - 4 of 4  /   
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