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Committee Date Time Place Paper Title / Authors Abstract Paper #
VLD 2010-09-28
15:50
Kyoto Kyoto Institute of Technology Modeling of Latching Probability of Soft-Error-Induced Pulse
Motoharu Hirata, Masayoshi Yoshimura, Yusuke Matsunaga (Kyusyu Univ.) VLD2010-56
This paper describes soft error which is one of the dependability decrease factors of LSI(Large Scale Integrated circuit... [more] VLD2010-56
pp.83-88
DC, CPSY 2009-04-21
13:50
Tokyo Akihabara Satellite Campus, Tokyo Metropolitan Univ. Fast Soft Error Rate Estimation for Circuits Containing Arithmetic Units
Motoharu Hirata, Masayoshi Yoshimura, Yusuke Matsunaga, Hiroto Yasuura (Kyushu Univ.) CPSY2009-5 DC2009-5
This paper describes soft errors which are errors in LSI that are due to external radiation.The soft error rate (SER) wh... [more] CPSY2009-5 DC2009-5
pp.25-30
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