IEICE Technical Committee Submission System
Conference Schedule
Online Proceedings
[Sign in]
Tech. Rep. Archives
    [Japanese] / [English] 
( Committee/Place/Topics  ) --Press->
 
( Paper Keywords:  /  Column:Title Auth. Affi. Abst. Keyword ) --Press->

All Technical Committee Conferences  (All Years)

Search Results: Conference Papers
 Conference Papers (Available on Advance Programs)  (Sort by: Date Descending)
 Results 1 - 4 of 4  /   
Committee Date Time Place Paper Title / Authors Abstract Paper #
SDM 2019-10-24
13:00
Miyagi Niche, Tohoku Univ. [Invited Talk] Random nanostructure formation and electric readout for nano-artifact metrics
Seiya Kasai, Renpeng Lu, Katsumi Shimizu, Xiang Yin (Hokkaido Univ.), Yosuke Ueba, Mikio Ishikawa, Mitsuru Kitamura (DNP), Morihisa Hoga (AIST), Makoto Naruse (Univ. of Tokyo), Tsutomu Matsumoto (YNU) SDM2019-62
We introduce a basic concept of nano-artifact metrics, expected to be a highly secure authentication technique using nan... [more] SDM2019-62
pp.45-50
HWS 2018-04-13
11:35
Fukuoka   Optical 3D Nano Artifact-metrics using White Light Interferometry
Naoki Yoshida (YNU), Yosuke Ueba, Shumpei Nishio, Yasuyuki Ohyagi (DNP), Morihisa Hoga (Compass21), Naoya Tate (KU), Makoto Naruse (NICT), Tsutomu Matsumoto (YNU) HWS2018-3
We propose an artificial-metric system which authenticates nanostructures with random irregularities by means of an inte... [more] HWS2018-3
pp.11-16
HWS 2018-04-13
15:00
Fukuoka   Discrimination of size and position of nanostructures embedded in MOSFET through drain current
Katsumi Shimizu (Hokkaido Univ.), Ueba Yosuke, Mitsuru Kitamura, Ohyagi Yasuyuki (DNP), Morihisa Hoga (Compass Two-One), Tate Naoya (Kyushu Univ.), Makoto Naruse (NICT), Tsutomu Matsumoto (Yokohama Natl. Univ.), Seiya Kasai (Hokkaido Univ.) HWS2018-7
(To be available after the conference date) [more] HWS2018-7
pp.35-39
IT, ISEC, WBS 2013-03-08
11:45
Osaka Kwansei Gakuin Univ., Osaka-Umeda Campus Nano Artifact-metrics based on Resist Collapsing
Tsutomu Matsumoto, Kenta Hanaki, Ryosuke Suzuki, Daiki Sekiguchi (Yokohama National Univ.), Morihisa Hoga, Yasuyuki Ohyagi (DNP), Makoto Naruse (NICT), Naoya Tate, Motoichi Ohtsu (Univ. of Tokyo) IT2012-96 ISEC2012-114 WBS2012-82
Artifact-metrics is an automated method of utilizing physical artifacts based on their measurable intrinsic characterist... [more] IT2012-96 ISEC2012-114 WBS2012-82
pp.217-222
 Results 1 - 4 of 4  /   
Choose a download format for default settings. [NEW !!]
Text format pLaTeX format CSV format BibTeX format
Copyright and reproduction : All rights are reserved and no part of this publication may be reproduced or transmitted in any form or by any means, electronic or mechanical, including photocopy, recording, or any information storage and retrieval system, without permission in writing from the publisher. Notwithstanding, instructors are permitted to photocopy isolated articles for noncommercial classroom use without fee. (License No.: 10GA0019/12GB0052/13GB0056/17GB0034/18GB0034)


[Return to Top Page]

[Return to IEICE Web Page]


The Institute of Electronics, Information and Communication Engineers (IEICE), Japan