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All Technical Committee Conferences (Searched in: All Years)
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Search Results: Conference Papers |
Conference Papers (Available on Advance Programs) (Sort by: Date Descending) |
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Committee |
Date Time |
Place |
Paper Title / Authors |
Abstract |
Paper # |
SANE |
2023-12-08 13:30 |
Overseas |
Surakarta, Indonesia (Primary: On-site, Secondary: Online) |
Design and Development of a Prototype
-- RealReal-Time OBD II Car Monitoring System System -- Refansyah Basu Dewa, Faisal Rahutomo, Miftahul Anwar, Joko Slamet Saputro (UNS) SANE2023-84 |
In this report, we utilize four key components to develop a real-time vehicle monitoring system for car rental services.... [more] |
SANE2023-84 pp.131-136 |
ED, SDM |
2012-02-07 14:35 |
Hokkaido |
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KFM observation of individual dopant potentials and electron charging Roland Nowak, Miftahul Anwar, Daniel Moraru, Takeshi Mizuno (Shizuoka Univ.), Ryszard Jablonski (Warsaw Univ. of Tech.), Michiharu Tabe (Shizuoka Univ.) ED2011-144 SDM2011-161 |
We utilize Kelvin probe force microscope (KFM) to measure surface potential of thin channel of nanoscale field effect tr... [more] |
ED2011-144 SDM2011-161 pp.13-18 |
ED, SDM |
2010-07-01 11:50 |
Tokyo |
Tokyo Inst. of Tech. Ookayama Campus |
[Invited Talk]
Si single-dopant devices and their characterization Michiharu Tabe, Daniel Moraru, Earfan Hamid, Miftahul Anwar, Arief Udhiarto, Ryusuke Nakamura, Sakito Miki, Takeshi Mizuno (Shizuoka Univ.) ED2010-80 SDM2010-81 |
[more] |
ED2010-80 SDM2010-81 pp.131-136 |
ED, SDM |
2008-01-30 14:20 |
Hokkaido |
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Dopant ionization in silicon nanodevices investigated by Kelvin Probe Force Microscope Maciej Ligowski (Shizuoka Univ./Warsaw Univ. of Tech.), Ratno Nuryadi, Akihiro Ichiraku, Miftahul Anwar (Shizuoka Univ.), Ryszard Jablonski (Warsaw Univ. of Tech.), Michiharu Tabe (Shizuoka Univ.) ED2007-239 SDM2007-250 |
Dopant ionization was investigated by Kelvin Probe Force Microscope (KFM) measurements of surface potential of the thin ... [more] |
ED2007-239 SDM2007-250 pp.11-16 |
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