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Committee Date Time Place Paper Title / Authors Abstract Paper #
SANE 2023-12-08
13:30		 Overseas Surakarta, Indonesia
(Primary: On-site, Secondary: Online)		 Design and Development of a Prototype -- RealReal-Time OBD II Car Monitoring System System --
Refansyah Basu Dewa, Faisal Rahutomo, Miftahul Anwar, Joko Slamet Saputro (UNS) SANE2023-84		 In this report, we utilize four key components to develop a real-time vehicle monitoring system for car rental services.... [more] SANE2023-84
pp.131-136
ED, SDM 2012-02-07
14:35		 Hokkaido   KFM observation of individual dopant potentials and electron charging
Roland Nowak, Miftahul Anwar, Daniel Moraru, Takeshi Mizuno (Shizuoka Univ.), Ryszard Jablonski (Warsaw Univ. of Tech.), Michiharu Tabe (Shizuoka Univ.) ED2011-144 SDM2011-161		 We utilize Kelvin probe force microscope (KFM) to measure surface potential of thin channel of nanoscale field effect tr... [more] ED2011-144 SDM2011-161
pp.13-18
ED, SDM 2010-07-01
11:50		 Tokyo Tokyo Inst. of Tech. Ookayama Campus [Invited Talk] Si single-dopant devices and their characterization
Michiharu Tabe, Daniel Moraru, Earfan Hamid, Miftahul Anwar, Arief Udhiarto, Ryusuke Nakamura, Sakito Miki, Takeshi Mizuno (Shizuoka Univ.) ED2010-80 SDM2010-81		  [more] ED2010-80 SDM2010-81
pp.131-136
ED, SDM 2008-01-30
14:20		 Hokkaido   Dopant ionization in silicon nanodevices investigated by Kelvin Probe Force Microscope
Maciej Ligowski (Shizuoka Univ./Warsaw Univ. of Tech.), Ratno Nuryadi, Akihiro Ichiraku, Miftahul Anwar (Shizuoka Univ.), Ryszard Jablonski (Warsaw Univ. of Tech.), Michiharu Tabe (Shizuoka Univ.) ED2007-239 SDM2007-250		 Dopant ionization was investigated by Kelvin Probe Force Microscope (KFM) measurements of surface potential of the thin ... [more] ED2007-239 SDM2007-250
pp.11-16
 Results 1 - 4 of 4  /   
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