IEICE Technical Committee Submission System
Conference Schedule
Online Proceedings
[Sign in]
Tech. Rep. Archives
    [Japanese] / [English] 
( Committee/Place/Topics  ) --Press->
 
( Paper Keywords:  /  Column:Title Auth. Affi. Abst. Keyword ) --Press->

All Technical Committee Conferences  (All Years)

Search Results: Conference Papers
 Conference Papers (Available on Advance Programs)  (Sort by: Date Descending)
 Results 1 - 20 of 46  /  [Next]  
Committee Date Time Place Paper Title / Authors Abstract Paper #
DC 2021-02-05
10:55
Tokyo Kikai-Shinko-Kaikan Bldg. and Online
(Primary: On-site, Secondary: Online)
Hardware Trojan Detection by Learning Power Side Channel Signals Considering Random Process Variation
Michiko Inoue, Riaz-Ul-Haque Mian (NAIST)
(To be available after the conference date) [more]
COMP, IPSJ-AL 2020-09-02
10:30
Online Online Uniform Bipartition in Population Protocol Model over Arbitrary Communication Networks
Hiroto Yasumi, Fukuhito Ooshita, Michiko Inoue (NAIST), Sebastien Tixeuil (Sorbonne Universite) COMP2020-8
In this paper, we focus on the uniform bipartition problem in the population protocol model. This problem aims to divide... [more] COMP2020-8
pp.17-24
COMP, IPSJ-AL 2020-05-09
16:15
Online Online Gathering for mobile agents with a strong team in weakly Byzantine environments
Jion Hirose, Masashi Tsuchida (NAIST), Junya Nakamura (TUT), Fukuhito Ooshita, Michiko Inoue (NAIST) COMP2020-2
We study the gathering problem requiring a team of mobile agents to gather at a single node in arbitrary networks. The t... [more] COMP2020-2
pp.9-16
HWS, VLD [detail] 2020-03-05
10:55
Okinawa Okinawa Ken Seinen Kaikan
(Cancelled but technical report was issued)
Fault-tolerant Design for Memristor Neural Network Using Checksum and Online Testing
Mamoru Ishizaka, Michihiro Shintani, Michiko Inoue (NAIST) VLD2019-112 HWS2019-85
 [more] VLD2019-112 HWS2019-85
pp.107-112
DC 2020-02-26
16:10
Tokyo   Accurate Recycled FPGA Detection Based on Exhaustive Path Analysis
Michihiro Shintani, Foisal Ahmed, Michiko Inoue (NAIST) DC2019-96
 [more] DC2019-96
pp.61-66
VLD, DC, CPSY, RECONF, ICD, IE, IPSJ-SLDM, IPSJ-EMB, IPSJ-ARC
(Joint) [detail]
2019-11-13
10:55
Ehime Ehime Prefecture Gender Equality Center VLD2019-31 DC2019-55 In testing of large scale integration (LSI) circuit, test escape detection using machine learning algorithms has been at... [more] VLD2019-31 DC2019-55
pp.13-18
COMP, IPSJ-AL 2019-05-11
15:10
Kumamoto Kumamoto University Ring Exploration Algorithms for Myopic Luminous Robots with Larger Visibility
Shota Nagahama, Fukuhito Ooshita, Michiko Inoue (NAIST) COMP2019-7
In this paper, we investigate ring exploration algorithms for autonomous mobile robots. The robots are myopic, that is, ... [more] COMP2019-7
pp.83-90
DC 2019-02-27
09:25
Tokyo Kikai-Shinko-Kaikan Bldg. Variational Autoencoder-Based Efficient Test Escape Detection
Michihiro Shintani (NAIST), Kouichi Kumaki (Renesas Electronics Corporation), Michiko Inoue (NAIST) DC2018-72
 [more] DC2018-72
pp.7-12
DC 2019-02-27
10:55
Tokyo Kikai-Shinko-Kaikan Bldg. Efficient Challenge-Response Pairs Generation and Evaluation for PUF Circuit Using BIST Circuit During Manufacturing Test
Tomoki Mino, Shintani Michihiro, Michiko Inoue (NAIST) DC2018-75
Recently, counterfeited ICs have become a big problem for semiconductor supply chains. One of the countermeasures for th... [more] DC2018-75
pp.25-30
DC 2019-02-27
11:45
Tokyo Kikai-Shinko-Kaikan Bldg. An Efficient Approach to Recycled FPGA Detection Using WID Variation Modeling
Foisal Ahmed, Michihiro Shintani, Michiko Inoue (NAIST) DC2018-77
Recycled field programmable gate arrays (FPGAs) make a significant threat to mission critical systems due to their perfo... [more] DC2018-77
pp.37-42
HWS, VLD 2019-02-28
15:20
Okinawa Okinawa Ken Seinen Kaikan A SPICE Model Parameter Extraction Environment Using Automatic Differentiation
Aoi Ueda (NNCT), Michihiro Shintani (NAIST), Hiroshi Iwata, Ken'ichi Yamaguchi (NNCT), Michiko Inoue (NAIST) VLD2018-117 HWS2018-80
Accuracy of circuit simulation highly relys on two techniques: compact modeling and parameter extraction. As increasing ... [more] VLD2018-117 HWS2018-80
pp.145-150
HCGSYMPO
(2nd)

Mie Sinfonia Technology Hibiki Hall Ise -
Naoto Kato, Michiko inoue, Shiraiwa Aya, Masashi Nishiyama, Yoshio Iwai (Tottori Univ)
We investigate recognition performance between people and deep learning techniques using a simple task of visual inspect... [more]
VLD, DC, CPSY, RECONF, CPM, ICD, IE, IPSJ-SLDM, IPSJ-EMB, IPSJ-ARC
(Joint) [detail]
2018-12-06
10:30
Hiroshima Satellite Campus Hiroshima VLD2018-50 DC2018-36  [more] VLD2018-50 DC2018-36
pp.83-88
COMP, IPSJ-AL 2018-05-26
14:00
Aichi Nagoya Institute of Technology Obstruction detection by asynchronous opaque robots using lights
Adam Heriban, Michiko Inoue, Fukuhito Ooshita (NAIST), Sebastien Tixeuil (Sorbonne Universite) COMP2018-5
 [more] COMP2018-5
pp.71-78
CPSY, DC, IPSJ-SLDM, IPSJ-EMB, IPSJ-ARC [detail] 2018-03-08
13:55
Shimane Okinoshima Bunka-Kaikan Bldg. CPSY2017-146 DC2017-102 Resistive RAM (ReRAM) is one of the most promising memory technologies due to its property such as high density, low-pow... [more] CPSY2017-146 DC2017-102
pp.257-262
DC 2018-02-20
14:25
Tokyo Kikai-Shinko-Kaikan Bldg. A Golden-Free Hardware Trojan Detection Technique Considering Intra-Die Variation
Fakir Sharif Hossain, Tomokazu Yoneda, Michihiro Shintani, Michiko Inoue (NAIST), Alex Orailoglu (Univ. of California, San Diego) DC2017-84
High detection sensitivity in the presence of process variation is a key challenge for hardware Trojan detection through... [more] DC2017-84
pp.43-48
DC 2017-12-15
15:55
Akita Akita Study Center, The Open University of Japan [Invited Talk] Hardware Trojan detection based on side-channel analysis
Michiko Inoue (NAIST) DC2017-76
A hardware Trojan, a malicious addition and/or modification to ICs, caused by outsourcing of design
and/or manufacturin... [more]
DC2017-76
pp.43-48
SS, DC 2017-10-20
10:00
Kochi Kochi City Culture-plaza CUL-PORT Efficient Self-Stabilizing 1-Maximal Matching Algorithm for Arbitrary Networks
Michiko Inoue, Fukuhito Ooshita (NAIST), Sebastien Tixeuil (UPMC) SS2017-31 DC2017-30
We present a new self-stabilizing 1-maximal matching algorithm that works under the distributed unfair daemon for arbitr... [more] SS2017-31 DC2017-30
pp.61-66
CPSY, DC, IPSJ-SLDM, IPSJ-EMB, IPSJ-ARC [detail] 2017-03-10
09:30
Okinawa Kumejima Island Pass/Fail Prediction in LSI Test Considering Fail Die Characteristics.
Takazumi Sato, Michiko Inoue (NAIST) CPSY2016-144 DC2016-90
Various kinds of tests are applied to LSIs in several satages to ship only fully reliable products.However, a lot of kin... [more] CPSY2016-144 DC2016-90
pp.291-296
DC 2016-12-16
13:00
Yamagata Sakata Sogo-Bunka Center(Sakata-City) High Reliable Memory Architecture with Adaptive Combination of Aging-Aware In-Field Self-Repair and ECC
Gian Mayuga, Yuta Yamato (NAIST), Yasuo Sato (KIT), Michiko Inoue (NAIST) DC2016-64
 [more] DC2016-64
pp.1-6
 Results 1 - 20 of 46  /  [Next]  
Choose a download format for default settings. [NEW !!]
Text format pLaTeX format CSV format BibTeX format
Copyright and reproduction : All rights are reserved and no part of this publication may be reproduced or transmitted in any form or by any means, electronic or mechanical, including photocopy, recording, or any information storage and retrieval system, without permission in writing from the publisher. Notwithstanding, instructors are permitted to photocopy isolated articles for noncommercial classroom use without fee. (License No.: 10GA0019/12GB0052/13GB0056/17GB0034/18GB0034)


[Return to Top Page]

[Return to IEICE Web Page]


The Institute of Electronics, Information and Communication Engineers (IEICE), Japan