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All Technical Committee Conferences (All Years)
| Committee | Date Time | Place | Paper Title / Authors | Abstract | Paper # | |
| COMP, IPSJ-AL | 2020-05-08 16:10 |
Tokyo | National Institute of Informatics | Gathering for mobile agents with a strong team in weakly Byzantine environments Jion Hirose, Masashi Tsuchida (NAIST), Junya Nakamura (TUT), Fukuhito Ooshita, Michiko Inoue (NAIST) |
[more] | |
| HWS, VLD [detail] | 2020-03-05 10:55 |
Okinawa | Okinawa Ken Seinen Kaikan | Fault-tolerant Design for Memristor Neural Network Using Checksum and Online Testing Mamoru Ishizaka, Michihiro Shintani, Michiko Inoue (NAIST)  VLD2019-112 HWS2019-85 |
[more] | VLD2019-112 HWS2019-85 pp.107-112 |
| DC | 2020-02-26 16:10 |
Tokyo | Accurate Recycled FPGA Detection Based on Exhaustive Path Analysis Michihiro Shintani, Foisal Ahmed, Michiko Inoue (NAIST) DC2019-96 |
[more] | DC2019-96 pp.61-66 |
|
| VLD, DC, CPSY, RECONF, ICD, IE, IPSJ-SLDM, IPSJ-EMB, IPSJ-ARC (Joint) [detail] |
2019-11-13 10:55 |
Ehime | Ehime Prefecture Gender Equality Center | VLD2019-31 DC2019-55 |
In testing of large scale integration (LSI) circuit, test escape detection using machine learning algorithms has been at... [more] | VLD2019-31 DC2019-55 pp.13-18 |
| COMP, IPSJ-AL | 2019-05-11 15:10 |
Kumamoto | Kumamoto University | Ring Exploration Algorithms for Myopic Luminous Robots with Larger Visibility Shota Nagahama, Fukuhito Ooshita, Michiko Inoue (NAIST) COMP2019-7 |
In this paper, we investigate ring exploration algorithms for autonomous mobile robots. The robots are myopic, that is, ... [more] | COMP2019-7 pp.83-90 |
| DC | 2019-02-27 09:25 |
Tokyo | Kikai-Shinko-Kaikan Bldg. | Variational Autoencoder-Based Efficient Test Escape Detection Michihiro Shintani (NAIST), Kouichi Kumaki (Renesas Electronics Corporation), Michiko Inoue (NAIST) DC2018-72 |
[more] | DC2018-72 pp.7-12 |
| DC | 2019-02-27 10:55 |
Tokyo | Kikai-Shinko-Kaikan Bldg. | Efficient Challenge-Response Pairs Generation and Evaluation for PUF Circuit Using BIST Circuit During Manufacturing Test Tomoki Mino, Shintani Michihiro, Michiko Inoue (NAIST) DC2018-75 |
Recently, counterfeited ICs have become a big problem for semiconductor supply chains. One of the countermeasures for th... [more] | DC2018-75 pp.25-30 |
| DC | 2019-02-27 11:45 |
Tokyo | Kikai-Shinko-Kaikan Bldg. | An Efficient Approach to Recycled FPGA Detection Using WID Variation Modeling Foisal Ahmed, Michihiro Shintani, Michiko Inoue (NAIST) DC2018-77 |
Recycled field programmable gate arrays (FPGAs) make a significant threat to mission critical systems due to their perfo... [more] | DC2018-77 pp.37-42 |
| HWS, VLD | 2019-02-28 15:20 |
Okinawa | Okinawa Ken Seinen Kaikan | A SPICE Model Parameter Extraction Environment Using Automatic Differentiation Aoi Ueda (NNCT), Michihiro Shintani (NAIST), Hiroshi Iwata, Ken'ichi Yamaguchi (NNCT), Michiko Inoue (NAIST) VLD2018-117 HWS2018-80 |
Accuracy of circuit simulation highly relys on two techniques: compact modeling and parameter extraction. As increasing ... [more] | VLD2018-117 HWS2018-80 pp.145-150 |
| HCGSYMPO (2nd) |
Mie | Sinfonia Technology Hibiki Hall Ise | - Naoto Kato, Michiko inoue, Shiraiwa Aya, Masashi Nishiyama, Yoshio Iwai (Tottori Univ) |
We investigate recognition performance between people and deep learning techniques using a simple task of visual inspect... [more] | ||
| VLD, DC, CPSY, RECONF, CPM, ICD, IE, IPSJ-SLDM, IPSJ-EMB, IPSJ-ARC (Joint) [detail] |
2018-12-06 10:30 |
Hiroshima | Satellite Campus Hiroshima | VLD2018-50 DC2018-36 |
[more] | VLD2018-50 DC2018-36 pp.83-88 |
| COMP, IPSJ-AL | 2018-05-26 14:00 |
Aichi | Nagoya Institute of Technology | Obstruction detection by asynchronous opaque robots using lights Adam Heriban, Michiko Inoue, Fukuhito Ooshita (NAIST), Sebastien Tixeuil (Sorbonne Universite) COMP2018-5 |
[more] | COMP2018-5 pp.71-78 |
| CPSY, DC, IPSJ-SLDM, IPSJ-EMB, IPSJ-ARC [detail] | 2018-03-08 13:55 |
Shimane | Okinoshima Bunka-Kaikan Bldg. | CPSY2017-146 DC2017-102 |
Resistive RAM (ReRAM) is one of the most promising memory technologies due to its property such as high density, low-pow... [more] | CPSY2017-146 DC2017-102 pp.257-262 |
| DC | 2018-02-20 14:25 |
Tokyo | Kikai-Shinko-Kaikan Bldg. | A Golden-Free Hardware Trojan Detection Technique Considering Intra-Die Variation Fakir Sharif Hossain, Tomokazu Yoneda, Michihiro Shintani, Michiko Inoue (NAIST), Alex Orailoglu (Univ. of California, San Diego) DC2017-84 |
High detection sensitivity in the presence of process variation is a key challenge for hardware Trojan detection through... [more] | DC2017-84 pp.43-48 |
| DC | 2017-12-15 15:55 |
Akita | Akita Study Center, The Open University of Japan | [Invited Talk]
Hardware Trojan detection based on side-channel analysis Michiko Inoue (NAIST) DC2017-76 |
A hardware Trojan, a malicious addition and/or modification to ICs, caused by outsourcing of design and/or manufacturin... [more] |
DC2017-76 pp.43-48 |
| SS, DC | 2017-10-20 10:00 |
Kochi | Kochi City Culture-plaza CUL-PORT | Efficient Self-Stabilizing 1-Maximal Matching Algorithm for Arbitrary Networks Michiko Inoue, Fukuhito Ooshita (NAIST), Sebastien Tixeuil (UPMC) SS2017-31 DC2017-30 |
We present a new self-stabilizing 1-maximal matching algorithm that works under the distributed unfair daemon for arbitr... [more] | SS2017-31 DC2017-30 pp.61-66 |
| CPSY, DC, IPSJ-SLDM, IPSJ-EMB, IPSJ-ARC [detail] | 2017-03-10 09:30 |
Okinawa | Kumejima Island | Pass/Fail Prediction in LSI Test Considering Fail Die Characteristics. Takazumi Sato, Michiko Inoue (NAIST) CPSY2016-144 DC2016-90 |
Various kinds of tests are applied to LSIs in several satages to ship only fully reliable products.However, a lot of kin... [more] | CPSY2016-144 DC2016-90 pp.291-296 |
| DC | 2016-12-16 13:00 |
Yamagata | Sakata Sogo-Bunka Center(Sakata-City) | High Reliable Memory Architecture with Adaptive Combination of Aging-Aware In-Field Self-Repair and ECC Gian Mayuga, Yuta Yamato (NAIST), Yasuo Sato (KIT), Michiko Inoue (NAIST) DC2016-64 |
[more] | DC2016-64 pp.1-6 |
| VLD, DC, CPSY, RECONF, CPM, ICD, IE (Joint) [detail] |
2016-11-30 11:45 |
Osaka | Ritsumeikan University, Osaka Ibaraki Campus | A Golden-IC Free Clock Tree Driven Authentication Approach for Hardware Trojan Detection Fakir Sharif Hossain, Tomokazu Yoneda, Michiko Inoue (NAIST), Alex Orailoglu (UCSD) VLD2016-67 DC2016-61 |
Due to outsourcing of numerous stages of the IC manufacturing process in different foundries, security risks such as har... [more] | VLD2016-67 DC2016-61 pp.135-140 |
| DC, SS | 2016-10-27 11:50 |
Shiga | Hikone Kinro-Fukushi Kaikan Bldg. | Faster Wait-free Randomized Consensus with an Oblivious Adversary for MRSW Register Model Sen Moriya (Kindai Univ.), Michiko Inoue (NAIST) SS2016-20 DC2016-22 |
We consider wait-free randomized consensus algorithms with an oblivious adversary in asynchronous shared-memory system u... [more] | SS2016-20 DC2016-22 pp.13-18 |
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