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 Conference Papers (Available on Advance Programs)  (Sort by: Date Descending)
 44件中 1~20件目  /  [Next]  
Committee Date Time Place Paper Title / Authors Abstract Paper #
COMP, IPSJ-AL 2020-05-08
16:10
Tokyo National Institute of Informatics Gathering for mobile agents with a strong team in weakly Byzantine environments
Jion Hirose, Masashi Tsuchida (NAIST), Junya Nakamura (TUT), Fukuhito Ooshita, Michiko Inoue (NAIST)
 [more]
HWS, VLD [detail] 2020-03-05
10:55
Okinawa Okinawa Ken Seinen Kaikan Fault-tolerant Design for Memristor Neural Network Using Checksum and Online Testing
Mamoru Ishizaka, Michihiro Shintani, Michiko Inoue (NAIST) VLD2019-112 HWS2019-85
 [more] VLD2019-112 HWS2019-85
pp.107-112
DC 2020-02-26
16:10
Tokyo   Accurate Recycled FPGA Detection Based on Exhaustive Path Analysis
Michihiro Shintani, Foisal Ahmed, Michiko Inoue (NAIST) DC2019-96
 [more] DC2019-96
pp.61-66
VLD, DC, CPSY, RECONF, ICD, IE, IPSJ-SLDM, IPSJ-EMB, IPSJ-ARC
(Joint) [detail]
2019-11-13
10:55
Ehime Ehime Prefecture Gender Equality Center VLD2019-31 DC2019-55 In testing of large scale integration (LSI) circuit, test escape detection using machine learning algorithms has been at... [more] VLD2019-31 DC2019-55
pp.13-18
COMP, IPSJ-AL 2019-05-11
15:10
Kumamoto Kumamoto University Ring Exploration Algorithms for Myopic Luminous Robots with Larger Visibility
Shota Nagahama, Fukuhito Ooshita, Michiko Inoue (NAIST) COMP2019-7
In this paper, we investigate ring exploration algorithms for autonomous mobile robots. The robots are myopic, that is, ... [more] COMP2019-7
pp.83-90
DC 2019-02-27
09:25
Tokyo Kikai-Shinko-Kaikan Bldg. Variational Autoencoder-Based Efficient Test Escape Detection
Michihiro Shintani (NAIST), Kouichi Kumaki (Renesas Electronics Corporation), Michiko Inoue (NAIST) DC2018-72
 [more] DC2018-72
pp.7-12
DC 2019-02-27
10:55
Tokyo Kikai-Shinko-Kaikan Bldg. Efficient Challenge-Response Pairs Generation and Evaluation for PUF Circuit Using BIST Circuit During Manufacturing Test
Tomoki Mino, Shintani Michihiro, Michiko Inoue (NAIST) DC2018-75
Recently, counterfeited ICs have become a big problem for semiconductor supply chains. One of the countermeasures for th... [more] DC2018-75
pp.25-30
DC 2019-02-27
11:45
Tokyo Kikai-Shinko-Kaikan Bldg. An Efficient Approach to Recycled FPGA Detection Using WID Variation Modeling
Foisal Ahmed, Michihiro Shintani, Michiko Inoue (NAIST) DC2018-77
Recycled field programmable gate arrays (FPGAs) make a significant threat to mission critical systems due to their perfo... [more] DC2018-77
pp.37-42
HWS, VLD 2019-02-28
15:20
Okinawa Okinawa Ken Seinen Kaikan A SPICE Model Parameter Extraction Environment Using Automatic Differentiation
Aoi Ueda (NNCT), Michihiro Shintani (NAIST), Hiroshi Iwata, Ken'ichi Yamaguchi (NNCT), Michiko Inoue (NAIST) VLD2018-117 HWS2018-80
Accuracy of circuit simulation highly relys on two techniques: compact modeling and parameter extraction. As increasing ... [more] VLD2018-117 HWS2018-80
pp.145-150
HCGSYMPO
(2nd)

Mie Sinfonia Technology Hibiki Hall Ise -
Naoto Kato, Michiko inoue, Shiraiwa Aya, Masashi Nishiyama, Yoshio Iwai (Tottori Univ)
We investigate recognition performance between people and deep learning techniques using a simple task of visual inspect... [more]
VLD, DC, CPSY, RECONF, CPM, ICD, IE, IPSJ-SLDM, IPSJ-EMB, IPSJ-ARC
(Joint) [detail]
2018-12-06
10:30
Hiroshima Satellite Campus Hiroshima VLD2018-50 DC2018-36  [more] VLD2018-50 DC2018-36
pp.83-88
COMP, IPSJ-AL 2018-05-26
14:00
Aichi Nagoya Institute of Technology Obstruction detection by asynchronous opaque robots using lights
Adam Heriban, Michiko Inoue, Fukuhito Ooshita (NAIST), Sebastien Tixeuil (Sorbonne Universite) COMP2018-5
 [more] COMP2018-5
pp.71-78
CPSY, DC, IPSJ-SLDM, IPSJ-EMB, IPSJ-ARC [detail] 2018-03-08
13:55
Shimane Okinoshima Bunka-Kaikan Bldg. CPSY2017-146 DC2017-102 Resistive RAM (ReRAM) is one of the most promising memory technologies due to its property such as high density, low-pow... [more] CPSY2017-146 DC2017-102
pp.257-262
DC 2018-02-20
14:25
Tokyo Kikai-Shinko-Kaikan Bldg. A Golden-Free Hardware Trojan Detection Technique Considering Intra-Die Variation
Fakir Sharif Hossain, Tomokazu Yoneda, Michihiro Shintani, Michiko Inoue (NAIST), Alex Orailoglu (Univ. of California, San Diego) DC2017-84
High detection sensitivity in the presence of process variation is a key challenge for hardware Trojan detection through... [more] DC2017-84
pp.43-48
DC 2017-12-15
15:55
Akita Akita Study Center, The Open University of Japan [Invited Talk] Hardware Trojan detection based on side-channel analysis
Michiko Inoue (NAIST) DC2017-76
A hardware Trojan, a malicious addition and/or modification to ICs, caused by outsourcing of design
and/or manufacturin... [more]
DC2017-76
pp.43-48
SS, DC 2017-10-20
10:00
Kochi Kochi City Culture-plaza CUL-PORT Efficient Self-Stabilizing 1-Maximal Matching Algorithm for Arbitrary Networks
Michiko Inoue, Fukuhito Ooshita (NAIST), Sebastien Tixeuil (UPMC) SS2017-31 DC2017-30
We present a new self-stabilizing 1-maximal matching algorithm that works under the distributed unfair daemon for arbitr... [more] SS2017-31 DC2017-30
pp.61-66
CPSY, DC, IPSJ-SLDM, IPSJ-EMB, IPSJ-ARC [detail] 2017-03-10
09:30
Okinawa Kumejima Island Pass/Fail Prediction in LSI Test Considering Fail Die Characteristics.
Takazumi Sato, Michiko Inoue (NAIST) CPSY2016-144 DC2016-90
Various kinds of tests are applied to LSIs in several satages to ship only fully reliable products.However, a lot of kin... [more] CPSY2016-144 DC2016-90
pp.291-296
DC 2016-12-16
13:00
Yamagata Sakata Sogo-Bunka Center(Sakata-City) High Reliable Memory Architecture with Adaptive Combination of Aging-Aware In-Field Self-Repair and ECC
Gian Mayuga, Yuta Yamato (NAIST), Yasuo Sato (KIT), Michiko Inoue (NAIST) DC2016-64
 [more] DC2016-64
pp.1-6
VLD, DC, CPSY, RECONF, CPM, ICD, IE
(Joint) [detail]
2016-11-30
11:45
Osaka Ritsumeikan University, Osaka Ibaraki Campus A Golden-IC Free Clock Tree Driven Authentication Approach for Hardware Trojan Detection
Fakir Sharif Hossain, Tomokazu Yoneda, Michiko Inoue (NAIST), Alex Orailoglu (UCSD) VLD2016-67 DC2016-61
Due to outsourcing of numerous stages of the IC manufacturing process in different foundries, security risks such as har... [more] VLD2016-67 DC2016-61
pp.135-140
DC, SS 2016-10-27
11:50
Shiga Hikone Kinro-Fukushi Kaikan Bldg. Faster Wait-free Randomized Consensus with an Oblivious Adversary for MRSW Register Model
Sen Moriya (Kindai Univ.), Michiko Inoue (NAIST) SS2016-20 DC2016-22
We consider wait-free randomized consensus algorithms with an oblivious adversary in asynchronous shared-memory system u... [more] SS2016-20 DC2016-22
pp.13-18
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