|
|
All Technical Committee Conferences (Searched in: All Years)
|
|
Search Results: Conference Papers |
Conference Papers (Available on Advance Programs) (Sort by: Date Descending) |
|
Committee |
Date Time |
Place |
Paper Title / Authors |
Abstract |
Paper # |
SDM, EID |
2017-12-22 16:30 |
Kyoto |
Kyoto University |
Study for hole- or electron- conduction of DNA/Si-MOSFET Hibiki Nakano, Matsuo Naoto, Akira Heya, Tadao Takada, Kazusige Yamana (Univ. of Hyogo), Tadashi Sato, Shin Yokoyama (Univ. Hiroshima), Omura Yasuhisa (Univ.Kansai) EID2017-28 SDM2017-89 |
[more] |
EID2017-28 SDM2017-89 pp.85-88 |
SDM, EID |
2016-12-12 15:15 |
Nara |
NAIST |
Study of the inverter circuit of DNA/Si-MOSFET due to the parasitic capacitance control Hibiki Nakano, Matsuo Naoto, Akira Heya, Tadao Takada, Kazusige Yamana (Univ. of Hyogo), Tadashi Sato, Shin Yokoyama (Univ. Hiroshima) EID2016-23 SDM2016-104 |
An input/output characteristics of the inverter composed of the DNA/Si-MOSFET and the parasitic capacity was studied. Th... [more] |
EID2016-23 SDM2016-104 pp.63-66 |
|
|
|
Copyright and reproduction :
All rights are reserved and no part of this publication may be reproduced or transmitted in any form or by any means, electronic or mechanical, including photocopy, recording, or any information storage and retrieval system, without permission in writing from the publisher. Notwithstanding, instructors are permitted to photocopy isolated articles for noncommercial classroom use without fee. (License No.: 10GA0019/12GB0052/13GB0056/17GB0034/18GB0034)
|
[Return to Top Page]
[Return to IEICE Web Page]
|