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Committee Date Time Place Paper Title / Authors Abstract Paper #
VLD, DC, IPSJ-SLDM, CPSY, RECONF, ICD, CPM
(Joint) [detail]
2011-11-29
09:25
Miyazaki NewWelCity Miyazaki Improvement of Test Data Compression Rate for Chiba-Scan Testing by Reconstructing Scan Chain
Masato Akagawa, Kazuteru Namba, Hideo Ito (Chiba univ.) VLD2011-72 DC2011-48
Scan design is one of design for testing. Chiba-Scan proposed in 2005 is one of scan design for delay fault testing. Chi... [more] VLD2011-72 DC2011-48
pp.121-126
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