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Committee Date Time Place Paper Title / Authors Abstract Paper #
EMD 2012-12-21
15:45
Tokyo Kikai-Shinko-Kaikan Bldg. Degradation Phenomenon of Electrical Contacts using hammering oscillating mechanism and micro-sliding mechanism -- A fundamental study on the performance of the hammering oscillating mechanism (26) --
Shin-ichi Wada, Keiji Koshida, Saindaa Norovling (TMC), Naoki Masuda (TCT), Kunio Yanagi, Hiroaki Kubota (TMC), Masashi Terasaki (TCT), Koichiro Sawa (NIT) EMD2012-95
Authors have studied the influence on electrical contacts by actual micro-oscillation using some oscillating mechanisms ... [more] EMD2012-95
pp.27-32
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