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All Technical Committee Conferences (Searched in: All Years)
| Committee | Date Time | Place | Paper Title / Authors | Abstract | Paper # | |
| SDM | 2020-02-07 09:35 |
Tokyo | Tokyo University-Hongo | [Invited Talk]
Impact of Homogeneously Dispersed Al Nanoclusters by Si-monolayer Insertion into Hf0.5Zr0.5O2 Film on FeFET Memory Array with Tight Threshold Voltage Distribution Tadashi Yamaguchi, Keiichi Maekawa, Takahiro Ohara, Atsushi Amo, Eiji Tsukuda, Kenichiro Sonoda, Hiroshi Yanagita, Masao Inoue, Masazumi Matsuura, Tomohiro Yamashita (Renesas)  SDM2019-89 |
[more] | SDM2019-89 pp.5-8 |
| SDM | 2019-01-29 13:20 |
Tokyo | Kikai-Shinko-Kaikan Bldg. | [Invited Talk]
Highly Reliable Ferroelectric Hf0.5Zr0.5O2 Film with Al Nanoclusters Embedded by Sub-Monolayer Doping Technique Tadashi Yamaguchi, Tiantian Zhang, Kazuyuki Omori, Yasuhiro Shimada, Yorinobu Kunimune, Takashi Ide, Masao Inoue, Masazumi Matsuura (Renesas) SDM2018-86 |
Highly reliable ferroelectric (FE) Hf0.5Zr0.5O2 (HZO) film with Al nanoclusters embedded by sub-monolayer doping techniq... [more] | SDM2018-86 pp.21-26 |
| SDM | 2018-10-17 14:00 |
Miyagi | Niche, Tohoku Univ. | [Invited Talk]
Fin-FET MONOS for Next Generation Automotive-MCU Shibun Tsuda, Tomoya Saito, Hirokazu Nagase, Yoshiyuki Kawashima, Atsushi Yoshitomi, Shinobu Okanishi, Tomohiro Hayashi, Takuya Maruyama, Masao Inoue, Seiji Muranaka, Shigeki Kato, Takuya Hagiwara, Hirokazu Saito, Tadashi Yamaguchi, Masaru Kadoshima, Takahiro Maruyama, Tatsuyoshi Mihara, Hiroshi Yanagita, Kenichiro Sonoda, Yasuo Yamaguchi, Tomohiro Yamashita (Renesas) SDM2018-52 |
[more] | SDM2018-52 pp.1-5 |
| SDM | 2018-01-30 14:00 |
Tokyo | Kikai-Shinko-Kaikan Bldg. | [Invited Talk]
Reliability and Scalability of FinFET Split-Gate MONOS Array with Tight Vth Distribution for 16/14nm-node Embedded Flash Shibun Tsuda, Tomoya Saito, Hirokazu Nagase, Yoshiyuki Kawashima, Atsushi Yoshitomi, Shinobu Okanishi, Tomohiro Hayashi, Takuya Maruyama, Masao Inoue, Seiji Muranaka, Shigeki Kato, Takuya Hagiwara, Hirokazu Saito, Tadashi Yamaguchi, Masaru Kadoshima, Takahiro Maruyama, Tatsuyoshi Mihara, Hiroshi Yanagita, Kenichiro Sonoda, Tomohiro Yamashita, Yasuo Yamaguchi (renesas) SDM2017-94 |
Reliability and scalability of split-gate metal-oxide nitride oxide silicon (SG-MONOS) are discussed for 16/14nm-node em... [more] | SDM2017-94 pp.13-16 |
| ICD | 2017-04-20 14:55 |
Tokyo | [Invited Lecture]
First demonstration of FinFET Split-Gate MONOS for High-Speed and Highly-Reliable Embedded Flash in 16/14nm-node and beyond Shibun Tsuda, Yoshiyuki Kawashima, Kenichiro Sonoda, Atsushi Yoshitomi, Tatsuyoshi Mihara, Shunichi Narumi, Masao Inoue, Seiji Muranaka, Takahiro Maruyama, Tomohiro Yamashita, Yasuo Yamaguchi (Renesas Electronics), Digh Hisamoto (Hitachi) ICD2017-7 |
FinFET split-gate metal-oxide nitride oxide silicon (SG-MONOS) Flash memories have been fabricated and operated for the ... [more] | ICD2017-7 pp.35-38 |
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| SDM | 2017-01-30 13:30 |
Tokyo | Kikai-Shinko-Kaikan Bldg. | [Invited Talk]
First Demonstration of FinFET Split-Gate MONOS for High-Speed and Highly-Reliable Embedded Flash in 16/14nm-node and Beyond Shibun Tsuda, Yoshiyuki Kawashima, Kenichiro Sonoda, Atsushi Yoshitomi, Tatsuyoshi Mihara, Shunichi Narumi, Masao Inoue, Seiji Muranaka, Takahiro Maruyama, Tomohiro Yamashita, Yasuo Yamaguchi (Renesas Electronics), Digh Hisamoto (Hitachi) SDM2016-134 |
FinFET split-gate metal-oxide nitride oxide silicon (SG-MONOS) Flash memories have been fabricated and operated for the ... [more] | SDM2016-134 pp.17-20 |
| WIT | 2016-07-16 13:00 |
Yamanashi | University of Yamanashi Organization for Information Management | The relationship between motor imagery and motor performance Yuko Sagara, Shohei Dobashi (Yamanashi Univ.), Masao Inoue (Shimadzu Corp.), Shinji Kotani, Katuhiro Koyama (Yamanashi Univ.) WIT2016-30 |
Although previous studies focused on the correlation between brain activities and the motor imagery capability, whether ... [more] | WIT2016-30 pp.41-45 |
| WIT, SP | 2011-10-06 14:00 |
Tokyo | TFT Bldg. | Trial of evaluation of interactive system to assist rehabilitation of upper extremity using fNIRS Tomohiko Miki (Shibaura Inst. Tech.), Ryuichi Sugimoto, Shuto Murai (Former Shibaura Inst. Tehch.), Fumihito Kasai (Showa University), Masao Inoue (Shimadzu), Michiko Ohkura (Shibaura Inst. Tech.) SP2011-56 WIT2011-38 |
We have developed an interactive system to assist rehabilitation of upper extremity. We measured fNIRS of an hemiplegic ... [more] | SP2011-56 WIT2011-38 pp.25-29 |
| AP, SAT (Joint) |
2010-07-23 15:00 |
Hokkaido | Kitami Inst. Tech. | Helicopter Satellite Communication System for disaster and emergency information Yutaka Ozaki, Gou Fukuda, Masao Inoue, Manabu Sawa, Shuji Nuimura (Mitsubishi Electric Corp.) SAT2010-24 |
In the field of disaster and emergency management, it is required to reduce the number of damage and accident by collect... [more] | SAT2010-24 pp.79-83 |
| EMD, CPM, LQE, OPE | 2006-08-24 16:25 |
Hokkaido | Chitose Arcadia Plaza | Durability of Optical Connectors with Scratched End-Face Ryo Nagase (NTT), Masao Inoue (Hirose Electric), Junji Taira (Seikoh Giken), Masato Shiino (Furukawa Electric) |
[more] | EMD2006-34 CPM2006-64 OPE2006-76 LQE2006-41 pp.49-53 |
| SDM | 2006-06-21 15:20 |
Hiroshima | Faculty Club, Hiroshima Univ. | Work-function engineering of poly-Si gate by Fermi level pinning and its impact on low power CMOSFET Yasuhiro Shimamoto (Hitachi), Jiro Yugami, Masao Inoue, Masaharu Mizutani, Takashi Hayashi, Masahiro Yoneda (Renesas) |
[more] | SDM2006-47 pp.31-35 |
| ICD, SDM | 2005-08-19 11:35 |
Hokkaido | HAKODATE KOKUSAI HOTEL | Gate work-function modulation in SiON/poly-Si gate stacks, and its impact on low power devices
-- Advantage of sub-monolayer Hf at SiON/poly-Si interface -- Jiro Yugami (Renesas), Yasuhiro Shimamoto (Hitachi), Masao Inoue, Masaharu Mizutani, Takashi Hayashi, Katsuya Shiga, Fumiko Fujita, Jyunichi Tuchimoto, Yoshikazu Ohno, Masahiro Yoneda (Renesas) |
Gate work-function (WF) is controlled by incorporating sub-monolayer Hf at SiON/poly-Si interface. This technique provid... [more] | SDM2005-149 ICD2005-88 pp.37-42 |
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