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All Technical Committee Conferences (Searched in: All Years)
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| Search Results: Conference Papers |
| Conference Papers (Available on Advance Programs) (Sort by: Date Descending) |
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| Committee |
Date Time |
Place |
Paper Title / Authors |
Abstract |
Paper # |
| ICD |
2006-05-26
14:45 |
Hyogo |
Kobe University |
1.83ps-Resolution CMOS Dynamic Arbitrary Timing Generator for >4GHz ATE Applications
Toshiyuki Okayasu, Masakatsu Suda, Kazuhiro Yamamoto, Shusuke Kantake, Satoshi Sudou, Daisuke Watanabe (Advantest) |
A high-speed, precise fully CMOS dynamic arbitrary timing generator for >4GHz automatic test equipment (ATE) application... [more] |
ICD2006-36
pp.83-87 |
| ICD |
2005-05-27
16:10 |
Hyogo |
Kobe Univ. |
A Programmable On-Chip Picosecond Jitter Measurement Circuit without a Reference Clock
Kiyotaka Ichiyama, Masahiro Ishida, Takahiro Yamaguchi (Advantest Labs.), Mani Soma (Univ. of Washington), Masakatsu Suda, Toshiyuki Okayasu, Daisuke Watanabe, Kazuhiro Yamamoto (Advantest) |
A new on-chip jitter measurement circuit, which does not require a reference clock, is proposed. It consists of a combin... [more] |
ICD2005-38
pp.57-60 |
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