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All Technical Committee Conferences (Searched in: All Years)
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Search Results: Conference Papers |
Conference Papers (Available on Advance Programs) (Sort by: Date Descending) |
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Committee |
Date Time |
Place |
Paper Title / Authors |
Abstract |
Paper # |
SRW, SeMI, CNR (Joint) |
2021-11-25 13:00 |
Tokyo |
Kikai-Shinko-Kaikan Bldg. (Primary: On-site, Secondary: Online) |
Proposal of a system for simultaneous measurement and visualization of biometric data using a cloud server Jadram Narumon, Li Yanzhi, Yuri Nakagawa, Midori Sugaya (SIT) CNR2021-7 |
(To be available after the conference date) [more] |
CNR2021-7 pp.1-4 |
R |
2021-10-22 13:00 |
Online |
Online |
Adversarial Attack Against COVID-19 CT Images Deep Learning System Li Yang, Liu Ai, Liu Shaoying (HU) |
[more] |
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HWS, VLD [detail] |
2020-03-06 13:00 |
Okinawa |
Okinawa Ken Seinen Kaikan (Cancelled but technical report was issued) |
Fundamental Study on Fault Analysis with Non-Uniform Faulty Values Caused at Fault Injection into Sequential Circuit Takumi Okamoto, Daisuke Fujimoto (NAIST), Kazuo Sakiyama, Li Yang (UEC), Yu-ichi Hayashi (NAIST) VLD2019-128 HWS2019-101 |
Fault analysis for the cryptographic module is roughly divided into two phases; those are injecting transient faults and... [more] |
VLD2019-128 HWS2019-101 pp.197-201 |
WIT, SP, ASJ-H, PRMU |
2015-06-19 14:25 |
Niigata |
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A Prototype of a Braille Dot Controlling Mechanism by Using a Movable Top Panel and Latching Li Yang, Tetsuya Watanabe (Niigata Univ.) PRMU2015-58 SP2015-27 WIT2015-27 |
To develop a multi-line refreshable braille display, we devised a dot controlling mechanism by using a movable top panel... [more] |
PRMU2015-58 SP2015-27 WIT2015-27 pp.153-156 |
PRMU |
2013-03-14 17:00 |
Tokyo |
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Study of Robust Facial Feature Localization by Modified Active Shape Model Li Yan, Luo Dan, Jun Ohya (Waseda Univ.) |
This paper proposes a modified Active Shape Model (ASM), which is featured by the following two modules: (1) A flexible ... [more] |
PRMU2012-202 pp.129-134 |
EMD |
2010-11-11 18:00 |
Overseas |
Xi'an Jiaotong University |
Measurement and Calculation of Eddy-Current Loss in Copper Shielding under DC Biased Excitation Zhigang Zhao, Fugui Liu, Z.Cheng, Y.Du, L.Liu, J.Zhang, Y.Fan, Weili Yan (Hebei Univ. of Tech.) |
[more] |
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