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 Conference Papers (Available on Advance Programs)  (Sort by: Date Descending)
 Results 1 - 14 of 14  /   
Committee Date Time Place Paper Title / Authors Abstract Paper #
EMCJ 2015-07-09
10:30
Tokyo Kikai-Shinko-Kaikan Bldg. Influence on IC Operation by Internal Electric Field of Metal Enclosure during Radiated Immunity Testing
Keisuke Nakamura, Kenji Sogo, Michiharu Yamada, Kouji Ichikawa (DENSO) EMCJ2015-32
 [more] EMCJ2015-32
pp.7-12
EMCJ, IEE-EMC 2013-12-20
15:50
Aichi Denso co. Estimation for 2r-port S-parameters by the r-Port Measurements
Noboru Maeda, Shinji Fukui, Takashi Naoi (NIPPON SOKEN), Kouji Ichikawa (DENSO), Toshikazu Sekine, Yasuhiro Takahashi (Gifu Univ.) EMCJ2013-107
An estimation method of the 2r-port S-parameters for reciprocal circuits is presented. In this method, several known loa... [more] EMCJ2013-107
pp.55-60
EMCJ, IEE-EMC 2012-12-14
15:15
Gifu Gifu Univ. Estimation of the 3-port S Parameters with 2-port Measurements and Its Application to the Immunity Testing System
Noboru Maeda, Shinji Fukui (SOKEN), Kouji Ichikawa, Yukihiko Sakurai (DENSO), Toshikazu Sekine, Yasuhiro Takahashi (Gifu Univ.) EMCJ2012-98
An estimation method of the three-port S parameters for the reciprocal circuit is presented. In this method, a known loa... [more] EMCJ2012-98
pp.81-85
VLD, DC, IPSJ-SLDM, CPSY, RECONF, ICD, CPM
(Joint) [detail]
2012-11-28
10:30
Fukuoka Centennial Hall Kyushu University School of Medicine A LSI-Package-Board co-evaluation of Power noise in the Digital LSI
Kumpei Yoshikawa, Yuta Sasaki (Kobe Univ.), Kouji Ichikawa (DENSO), Yoshiyuki Saito (Panasonic), Makoto Nagata (Kobe Univ.) VLD2012-91 DC2012-57
Problems related with power noise in LSI system are getting prominent
because of the higher integration and lower $V_{d... [more]
VLD2012-91 DC2012-57
pp.183-188
EMCJ 2012-04-20
15:10
Ishikawa Kanazawa Univ. Integrated evaluation of on-board and on-chip power noise measurement results in digital LSI
Kumpei Yoshikawa, Yuta Sasaki (Kobe Univ.), Kouji Ichikawa (DENSO), Makoto Nagata (Kobe Univ.) EMCJ2012-7
In recent LSI system designs, noise environment of LSI system is getting worse.
Therefore proper noise oriented design ... [more]
EMCJ2012-7
pp.37-42
VLD, DC, IPSJ-SLDM, CPSY, RECONF, ICD, CPM
(Joint) [detail]
2011-11-30
09:25
Miyazaki NewWelCity Miyazaki Measurements and Co-Simulation of On-Chip and On-Boad AC Power Noise in Digital Integrated Circuits
Kumpei Yoshikawa, Yuta Sasaki (Kobe Univ.), Kouji Ichikawa (DENSO), Yoshiyuki Saito (Panasonic), Makoto Nagata (Kobe Univ./CREST,JST) CPM2011-163 ICD2011-95
Power noise of an integrated circuit (IC) chip is dominantly characterized by the frequency-domain impedance of a chip-p... [more] CPM2011-163 ICD2011-95
pp.73-78
VLD, DC, IPSJ-SLDM, CPSY, RECONF, ICD, CPM
(Joint) [detail]
2008-11-18
15:35
Fukuoka Kitakyushu Science and Research Park [Invited Talk] PCB design technology for System LSI -- EMC System Design --
Kouji Ichikawa (DENSO CORPORATION) CPM2008-93 ICD2008-92
Computerized vehicle electronic equipments increasingly require high performance LSI. EMC performance of these electroni... [more] CPM2008-93 ICD2008-92
pp.25-30
EMCJ 2008-07-17
13:40
Tokyo Kikai-Shinko-Kaikan Bldg Evaluation of Multiple Power-Supply Pin LECCS-core Model with Different Pattern Design Boards
Ryota Higashi, Kengo Iokibe (Okayama Univ.), Takahiro Tsuda, Kouji Ichikawa, Katsumi Nakamura (DENSO CORP.), Yoshitaka Toyota, Ryuji Koga (Okayama Univ.) EMCJ2008-33
We have proposed an EMC macro model, LECCS, to achieve fast simulations of RF power currents in IC/LSIs. The model consi... [more] EMCJ2008-33
pp.43-48
CPM, ICD 2008-01-17
09:40
Tokyo Kikai-Shinko-Kaikan Bldg Integrated evaluation of on-chip power supply noise and off-chip electromagnetic noise on digital LSI
Yuki Takahashi (Kobe Univ.), Kouji Ichikawa (Denso), Makoto Nagata (Kobe Univ.) CPM2007-129 ICD2007-140
 [more] CPM2007-129 ICD2007-140
pp.5-10
EMCJ 2006-12-15
10:30
Aichi Nagoya Institute of Technology EMI Model improvement taking LSI package structure into consideration
Takahiro Tsuda, Takanori Uno, Kouji Ichikawa (DENSO) EMCJ2006-84
An LSI EMI model was used to analyze conducted emission noise in a PCB. This model has been problem that the accuracy o... [more] EMCJ2006-84
pp.19-24
EMCJ 2006-12-15
13:10
Aichi Nagoya Institute of Technology Difference Reduction Effects of Ground Patterns on Conductive Noise Currents from PCB
Tsuyoshi Maeno, Takanori Uno, Kouji Ichikawa (DENSO), Osamu Fujiwara (NIT) EMCJ2006-88
In this paper, for reducing conductive noise currents from electronic equipment for vehicles, we made a simulation and e... [more] EMCJ2006-88
pp.41-46
EMCJ 2006-01-16
11:30
Fukuoka Kyushu University S-parametesr Modeling Method for Immunity Noise Test Instrumentations
Masahito Hirayama, Noboru Maeda (SOKEN), Kouji Ichikawa, Masashi Inagaki, Yukihiko Sakurai (DENSO)
 [more] EMCJ2005-128
pp.7-10
EMCJ 2005-09-09
13:15
Kyoto Kyoto University An Approach to Predict Conducted Noise Current Spectra from Electronics Equipments for Vehicles
Tsuyoshi Maeno, Kouji Ichikawa, Takanori Uno, Masaki Miyamoto, Kenji Katoh (DENSO)
In this paper we made an investigation for reducing electromagnetic emission radiated from electronic equipment for vehi... [more] EMCJ2005-72
pp.79-84
EMCJ 2004-12-10
16:15
Aichi Nagoya Institute of Technology A Study on Measurement of LSI Immunity for PCB Analysis
Kouji Ichikawa, Yukihiko Sakurai, Masashi Inagaki, Takeshi Matsui (DENSO), Yuichi Mabuchi (Hitachi), Atsushi Nakamura, Toru Hayashi (Renesas Technology)
We have been developing an LSI model for EMS simulation in automotive electronic control units.
PCB immunity was analyz... [more]
EMCJ2004-115
pp.77-82
 Results 1 - 14 of 14  /   
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