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Committee Date Time Place Paper Title / Authors Abstract Paper #
ICD 2013-04-11
11:40
Ibaraki Advanced Industrial Science and Technology (AIST) [Invited Talk] Filament Scaling Forming Technique and Level-Verify-Write Scheme with Endurance Over 10 million Cycles in ReRAM
Akifumi Kawahara, Ken Kawai, Yuuichirou Ikeda, Yoshikazu Katoh, Ryotaro Azuma, Yuhei Yoshimoto, Kouhei Tanabe, Zhiqiang Wei, Takeki Ninomiya, Koji Katayama, Shunsaku Muraoka, Atsushi Himeno, Kazuhiko Shimakawa, Takeshi Takagi, Kunitoshi Aono (Panasonic) ICD2013-4
Endurance characteristics over 10 million cycles almost 10 times higher as existing, and the small filament for leading ... [more] ICD2013-4
pp.15-20
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