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 Conference Papers (Available on Advance Programs)  (Sort by: Date Descending)
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Committee Date Time Place Paper Title / Authors Abstract Paper #
IE, ITS, ITE-MMS, ITE-ME, ITE-AIT [detail] 2023-02-21
15:15		 Hokkaido Hokkaido Univ. Conveyance of Creator's Intent Due to Differences in Image Aspect Ratios
Kosuke Nomura, Satochi Oode, Yoshitaka Ikeda (NHK) 		We conducted a subjective evaluation experiment to verify whether the image aspect ratio makes a difference in the ease ... [more]
MI, IE, SIP, BioX, ITE-IST, ITE-ME [detail] 2020-05-28
09:20		 Online Online Effect of Data Allocation between Number of Pixels and Frame Rate for Subjective Quality of Motion Image under a Fixed Data Rate
Yoshitaka Ikeda, Kosuke Nomura, Yuichi Kusakabe (NHK) 		In this study, we conducted a subjective evaluation using a stimulus-comparison method (adjectival categorical judgement... [more]
EMCJ 2012-01-27
16:10		 Fukuoka Kyushu Univ. Malfunction Analysis of SiC-SIT DC Circuit Breaker for Short Accident in 400V DC Power Supply System
Kosuke Nomura (Kyushu Univ.), Seiya Abe (ICSEAD), Sihun Yang, Masahito Shoyama (Kyushu Univ.), Tamotsu Ninomiya (Nagasaki Univ.), Akira Matsumoto, Akiyoshi Fukui (NTT Facilities) EMCJ2011-129		 In DC power supply system, a fast response circuit breaker is required. This paper considers and analyzes the malfunctio... [more] EMCJ2011-129
pp.105-110
EE 2010-01-22
16:30		 Fukuoka   Malfunction Mechanism of Semiconductor Circuit Breaker in 400V DC Power Supply System
Kosuke Nomura, Seiya Abe, Kentaro Fukushima, Masahito Shoyama (Kyushu Univ.), Akira Matsumoto, Akiyoshi Fukui, Mikio Yamasaki (NTT Facilities), Tamotsu Ninomiya (Nagasaki Univ.) EE2009-54		  [more] EE2009-54
pp.105-109
EE 2009-02-12
10:25		 Overseas Industrial Technology Research Institute Noise Characteristics of the Semiconductor Switch in Short Circuit on DC Power Supply System
Jing Cui, Kosuke Nomura, Seiya Abe, Masahito Shoyama (Kyushu Univ.), Akira Matsumoto, Akiyoshi Fukui, Mikio Yamasaki (NTT Facilities, Inc.), Tamotsu Ninomiya (Nagasaki Univ.) EE2008-65		  [more] EE2008-65
pp.17-22
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