IEICE Technical Committee Submission System
Conference Schedule
Online Proceedings
[Sign in]
Tech. Rep. Archives
    [Japanese] / [English] 
( Committee/Place/Topics  ) --Press->
 
( Paper Keywords:  /  Column:Title Auth. Affi. Abst. Keyword ) --Press->

All Technical Committee Conferences  (All Years)

Search Results: Conference Papers
 Conference Papers (Available on Advance Programs)  (Sort by: Date Descending)
 Results 1 - 4 of 4  /   
Committee Date Time Place Paper Title / Authors Abstract Paper #
ICD 2016-04-14
13:50
Tokyo Kikai-Shinko-Kaikan Bldg. [Invited Lecture] Reliability Projecting for ReRAM based on Stochastic Differential Equation
Zhiqiang Wei (PSCS), Koji Eriguchi (Kyoto Univ.), Shunsaku Muraoka, Koji Katayama, Ryotaro Yasuhara, Kawai Ken, Yukio Hayakawa, Kazuhiko Shimakawa, Takumi Mikawa, Yoneda Shinichi (PSCS) ICD2016-7
An analytic formula based on stochastic differential equation is successfully developed to describe intrinsic ReRAM vari... [more] ICD2016-7
pp.33-37
OFT, PEM
(Joint)
2015-05-21
14:25
Ishikawa   Reflowable thermoplastic optical lens module for 10Gbps transmission with 850nm VCSEL
Takayuki Shimazu, Michiko Harumoto, Tomomi Sano (SEI), Takuro Watanabe (NTD), Shohei Okabe, Koji Katayama (SFP), Satoshi Yamazaki, Shinya Nishikawa (SEI) OFT2015-4
The thermoplastic optical lens that made by conventional injection molding method is productivity and cost effective but... [more] OFT2015-4
pp.17-20
ICD 2013-04-11
11:40
Ibaraki Advanced Industrial Science and Technology (AIST) [Invited Talk] Filament Scaling Forming Technique and Level-Verify-Write Scheme with Endurance Over 10 million Cycles in ReRAM
Akifumi Kawahara, Ken Kawai, Yuuichirou Ikeda, Yoshikazu Katoh, Ryotaro Azuma, Yuhei Yoshimoto, Kouhei Tanabe, Zhiqiang Wei, Takeki Ninomiya, Koji Katayama, Shunsaku Muraoka, Atsushi Himeno, Kazuhiko Shimakawa, Takeshi Takagi, Kunitoshi Aono (Panasonic) ICD2013-4
Endurance characteristics over 10 million cycles almost 10 times higher as existing, and the small filament for leading ... [more] ICD2013-4
pp.15-20
CPM, LQE, ED 2010-11-12
11:15
Osaka   Vertical Heterojunction Field-Effect Transistors on Low Dislocation Density GaN Substrates
Masaya Okada, Yu Saitoh, Mitsunori Yokoyama, Ken Nakata, Seiji Yaegassi, Koji Katayama, Masaki Ueno, Makoto Kiyama, Tsukuru Katsuyama, Takao Nakamura (SEI) ED2010-157 CPM2010-123 LQE2010-113
A novel vertical heterojunction field-effect transistors (VHFETs) with re-grown AlGaN/GaN two-dimensional electron gas c... [more] ED2010-157 CPM2010-123 LQE2010-113
pp.67-70
 Results 1 - 4 of 4  /   
Choose a download format for default settings. [NEW !!]
Text format pLaTeX format CSV format BibTeX format
Copyright and reproduction : All rights are reserved and no part of this publication may be reproduced or transmitted in any form or by any means, electronic or mechanical, including photocopy, recording, or any information storage and retrieval system, without permission in writing from the publisher. Notwithstanding, instructors are permitted to photocopy isolated articles for noncommercial classroom use without fee. (License No.: 10GA0019/12GB0052/13GB0056/17GB0034/18GB0034)


[Return to Top Page]

[Return to IEICE Web Page]


The Institute of Electronics, Information and Communication Engineers (IEICE), Japan