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Committee Date Time Place Paper Title / Authors Abstract Paper #
DC 2009-06-19
Tokyo Kikai-Shinko-Kaikan Bldg. *
Koichiro Noguchi, Koichi Nose (NEC Corp.), Toshinobu Ono (NEC Electronics Corp.), Masayuki Mizuno (NEC Corp.) DC2009-16
 [more] DC2009-16
ICD, SDM 2008-07-17
Tokyo Kikai-Shinko-Kaikan Bldg. A small-delay defect detection technique for dependable LSIs
Koichiro Noguchi, Koichi Nose (NEC), Toshinobu Ono (NECEL), Masayuki Mizuno (NEC) SDM2008-132 ICD2008-42
As continuous process scaling produces large-scale chips, small-delay defects become one of the major chip-reliability l... [more] SDM2008-132 ICD2008-42
ICD, VLD 2007-03-07
Okinawa Mielparque Okinawa On-chip monitoring for sub-100-nm digital signal integrity
Yoji Bando, Koichiro Noguchi, Makoto Nagata (Kobe Univ.)
A compact on-chip signal monitor circuit uses voltage mode sensing by a source follower circuit with small input device ... [more] VLD2006-116 ICD2006-207
ICD, ITE-CE 2006-12-15
Hiroshima   Analog circuit operation diagnosis by on-chip multi-channel waveform monitor
Shuichi Sato, Takushi Hashida, Koichiro Noguchi, Makoto Nagata (Kove Univ.)
 [more] ICD2006-158
ICD, ITE-IST 2006-07-27
Shizuoka   A Signal Measurement System using On-Chip Multi-Channel Waveforme Monitor
Takushi Hashida, Koichiro Noguchi, Makoto Nagata (Kobe Univ.)
This paper describes measurement system consisted of a FPGA board and
on-chip multi-channel waveforme monitor circuits,... [more]
ICD 2005-07-14
Aichi Toyohashi Univ. of Tech. On-Chip Multi-Channel Waveform Monitoring for Diagnostics of Mixed-Signal VLSI Circuits
Koichiro Noguchi, Makoto Nagata (Kobe Univ.)
 [more] ICD2005-40
 Results 1 - 6 of 6  /   
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