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 Conference Papers (Available on Advance Programs)  (Sort by: Date Descending)
 Results 1 - 13 of 13  /   
Committee Date Time Place Paper Title / Authors Abstract Paper #
EMCJ 2012-04-20
14:20		 Ishikawa Kanazawa Univ. Study on Pigtail Grounding of Shield Sheath in Shielded Twisted Pair Cable
Yosuke Watanabe, Yuichi Sasaki, Chiharu Miyazaki, Naoto Oka, Koichiro Misu (Melco) EMCJ2012-5		  [more] EMCJ2012-5
pp.25-29
EMCJ 2011-07-14
09:05		 Tokyo Kikai-Shinko-Kaikan Bldg. Simulation of Conductive Noise considering Time Variability
Kenji Hirose, Satoshi Yoneda, Chiharu Miyazaki, Naoto Oka, Koichiro Misu (Mitsubishi Electric) EMCJ2011-44		 A large amount of conductive noise often becomes a problem in switching power converters, because high electric power is... [more] EMCJ2011-44
pp.1-5
EMCJ 2011-07-14
09:30		 Tokyo Kikai-Shinko-Kaikan Bldg. Calculation of Noise Suppressing Effect of Common Mode Choke Coil using Finite Element Method
Fujiyuki Nakamoto, Takeshi Uchida, Chiharu Miyazaki, Naoto Oka, Koichiro Misu (Mitsubishi Electric Corp.) EMCJ2011-45		  [more] EMCJ2011-45
pp.7-11
EMCJ, MW, EST 2011-05-26
09:05		 Tokyo NICT Layout of amplifiers connected with element antennas for electromagnetic field immunity test system applying 128-element array antenna.
Takeshi Uchida, Chiharu Miyazaki, Naoto Oka, Koichiro Misu, Yoshihiko Konishi (Mitsubishi Electric Corp.) EMCJ2011-8 MW2011-5 EST2011-1		  [more] EMCJ2011-8 MW2011-5 EST2011-1
pp.1-4
EMCJ, MW, EST 2011-05-26
09:30		 Tokyo NICT A Study of visualization method of injection noise distribution on the PCB with operating components
Yuji Ando, Takeshi Uchida, Yuichi Sasaki, Chiharu Miyazaki, Naoto Oka, Koichiro Misu (Mitsubisshi Electric) EMCJ2011-9 MW2011-6 EST2011-2		 To design electronic circuits considering noise immunity, it is necessary to identify the propagation route of the noise... [more] EMCJ2011-9 MW2011-6 EST2011-2
pp.5-8
EMCJ 2010-07-15
11:05		 Tokyo Kikai-Shinko-Kaikan Bldg. Evaluation of immunity characteristics for power supply terminal of RF components
Fujiyuki Nakamoto, Takeshi Uchida, Chiharu Miyazaki, Naoto Oka, Koichiro Misu (Mitsubishi Electric Corp.) EMCJ2010-21		  [more] EMCJ2010-21
pp.1-4
EMCJ 2010-04-23
09:35		 Tokyo Kikai-Shinko-Kaikan Bldg. Evaluation of Radiated Emission Measurement System over 1 GHz without Height Scanning of Receiving Antenna
Yuji Ando, Yuichi Sasaki, Chiharu Miyazaki, Naoto Oka, Koichiro Misu, Yoshihiko Konishi (MELCO) EMCJ2010-1		 Radiated emission(EMI) measurement method over 1 GHz is specified to CISPR16-2-3 and VCCI will regulate radiated emissio... [more] EMCJ2010-1
pp.1-6
EMCJ 2010-04-23
10:25		 Tokyo Kikai-Shinko-Kaikan Bldg. Study on Measurement Method of Twisted Pair Cable with Shielding Sheath
Yosuke Watanabe, Yuichi Sasaki, Chiharu Miyazaki, Naoto Oka, Koichiro Misu (Melco) EMCJ2010-3		 Recently, the application field of a high-speed differential transmission system has expanded, and shielded twisted pair... [more] EMCJ2010-3
pp.13-18
EMCJ 2010-01-21
10:25		 Okinawa University of the Ryukyus An electromagnetic field immunity test system applying 128-element array antenna
Takeshi Uchida, Chiharu Miyazaki, Naoto Oka, Koichiro Misu, Yoshihiko Konishi (Mitsubishi Electric Corp.) EMCJ2009-100		 Abstract The electromagnetic field immunity test system (such as IEC61000-4-3, SAE J1113-21) defines not only exposing a... [more] EMCJ2009-100
pp.13-17
EMCJ 2010-01-22
10:30		 Okinawa University of the Ryukyus Evaluation of Noise Voltage Transmitted from an External Cable to PCB's Signal Traces
Takefumi Kumamoto, Hiroyuki Matsumura (Mitsubishi Electric Engineering Company Limited), Naoto Oka, Koichiro Misu (Mitsubishi Electric Corp.) EMCJ2009-114		 This study experimentally clarifies the relationship between the common mode noise induced on the cable connected to the... [more] EMCJ2009-114
pp.93-98
EMD, EMCJ 2009-05-22
15:00		 Tokyo Kanda camupus, Nippon Institute of Technology Electric field strength from an electromagnetic field immunity test system applying array antenna technology
Takeshi Uchida, Chiharu Miyazaki, Naoto Oka, Koichiro Misu, Yoshihiko Konishi (Mitsubishi Electric Corp.) EMCJ2009-18 EMD2009-10		 The electromagnetic field immunity test system (such as MIL-STD-461 [1], SAE J1113-21 [2]) defines not only exposing an ... [more] EMCJ2009-18 EMD2009-10
pp.49-53
EMD, EMCJ 2009-05-22
15:25		 Tokyo Kanda camupus, Nippon Institute of Technology Voltage Distribution Measurement of Power Plane by Decoupling Capacitor on PCBs
Yuichi Sasaki, Chiharu Miyazaki, Naoto Oka, Koichiro Misu (MITSUBISHI ELECTRIC) EMCJ2009-19 EMD2009-11		  [more] EMCJ2009-19 EMD2009-11
pp.55-59
EMCJ 2008-07-17
14:05		 Tokyo Kikai-Shinko-Kaikan Bldg Dependency on Joint with Different Shape and Shielding Effectiveness
Yosuke Watanabe, Takeshi Uchida, Chiharu Miyazaki, Naoto Oka, Koichiro Misu, Yoshihiko Konishi (Melco) EMCJ2008-34		  [more] EMCJ2008-34
pp.49-54
 Results 1 - 13 of 13  /   
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