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Committee Date Time Place Paper Title / Authors Abstract Paper #
DC, CPSY 2009-04-21
11:00
Tokyo Akihabara Satellite Campus, Tokyo Metropolitan Univ. Highly Reliable Sequential Circuits Considering Multiple Simultaneous Transient Faults
Hideo Kohinata, Kohei Marumoto, Masayuki Arai, Satoshi Fukumoto (Tokyo Metropolitan Univ.) CPSY2009-1 DC2009-1
This paper proposes a novel technique to improve the reliability of sequential circuits. The proposed technique adopts t... [more] CPSY2009-1 DC2009-1
pp.1-6
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